loadpatents
Patent applications and USPTO patent grants for Chung; Hung-Yi.The latest application filed is for "hot spot defect detecting method and hot spot defect detecting system".
Patent | Date |
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Method for semiconductor wafer inspection and system thereof Grant 11,231,376 - Chen , et al. January 25, 2 | 2022-01-25 |
Hot Spot Defect Detecting Method And Hot Spot Defect Detecting System App 20210118125 - Chen; Chien-Huei ;   et al. | 2021-04-22 |
Method For Semiconductor Wafer Inspection And System Thereof App 20210063319 - CHEN; CHIEN-HUEI ;   et al. | 2021-03-04 |
Hot spot defect detecting method and hot spot defect detecting system Grant 10,872,406 - Chen , et al. December 22, 2 | 2020-12-22 |
Defect inspection method and defect inspection system Grant 10,809,635 - Chen , et al. October 20, 2 | 2020-10-20 |
Hot Spot Defect Detecting Method And Hot Spot Defect Detecting System App 20190318471 - Chen; Chien-Huei ;   et al. | 2019-10-17 |
Defect Inspection Method And Defect Inspection System App 20190155164 - Chen; Chien-Huei ;   et al. | 2019-05-23 |
Flash memory storage apparatus Grant 8,482,128 - Lin , et al. July 9, 2 | 2013-07-09 |
Flash Memory Storage Apparatus App 20120230102 - Lin; Yu-Fong ;   et al. | 2012-09-13 |
Flash memory storage apparatus Grant 8,222,743 - Lin , et al. July 17, 2 | 2012-07-17 |
Storage apparatus Grant 8,120,903 - Lin , et al. February 21, 2 | 2012-02-21 |
Flash Memory Storage Apparatus App 20100252931 - LIN; YU-FONG ;   et al. | 2010-10-07 |
Flash memory disk with rotatable and telescopic protection structure and method using the same Grant 7,672,122 - Lin , et al. March 2, 2 | 2010-03-02 |
Flash Memory Disk With Rotatable And Telescopic Protection Structure And Method Using The Same App 20090122478 - Lin; Wei-Hung ;   et al. | 2009-05-14 |
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