Patent | Date |
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MOS transistors having low-resistance salicide gates and a self-aligned contact between them Grant 7,605,414 - Chung October 20, 2 | 2009-10-20 |
MOS transistors having low-resistance salicide gates and a self-aligned contact between them and method of manufacture Grant 7,541,271 - Chung June 2, 2 | 2009-06-02 |
Method for reducing dimensions between patterns on a hardmask Grant 7,361,604 - Chung , et al. April 22, 2 | 2008-04-22 |
Method for reducing dimensions between patterns on a photoresist Grant 7,303,995 - Chung , et al. December 4, 2 | 2007-12-04 |
MOS transistors having low-resistance salicide gates and a self-aligned contact between them and method of manufacture App 20070207602 - Chung; Henry Wei-Ming | 2007-09-06 |
MOS transistors having low-resistance salicide gates and a self-aligned contact between them and method of manufacture App 20060163667 - Chung; Henry Wei-Ming | 2006-07-27 |
Method for reducing dimensions between patterns on a photoresist Grant 7,033,948 - Chung , et al. April 25, 2 | 2006-04-25 |
Method of fabricating phase shift mask Grant 6,887,627 - Chung , et al. May 3, 2 | 2005-05-03 |
Dual salicides for integrated circuits Grant 6,809,018 - Chung October 26, 2 | 2004-10-26 |
Method for reducing dimensions between patterns on a photoresist App 20040132225 - Chung, Henry Wei-Ming ;   et al. | 2004-07-08 |
Method for reducing dimensions between patterns on a photoresist Grant 6,750,150 - Chung , et al. June 15, 2 | 2004-06-15 |
Method for manufacturing an array structure in integrated circuits Grant 6,709,923 - Chung March 23, 2 | 2004-03-23 |
Method and structure of interconnection with anti-reflection coating App 20040018697 - Chung, Henry Wei-Ming | 2004-01-29 |
Dual salicides for integrated circuits App 20040009652 - Chung, Henry Wei-Ming | 2004-01-15 |
Method For Manufacturing An Array Structure In Integrated Circuits App 20030235950 - Chung, Henry Wei-Ming | 2003-12-25 |
Method for reducing dimensions between patterns on a photomask App 20030224254 - Chung, Henry Wei-Ming ;   et al. | 2003-12-04 |
Method for reducing dimensions between patterns on a hardmask App 20030224602 - Chung, Henry Wei-Ming ;   et al. | 2003-12-04 |
Method for reducing dimensions between patterns on a photoresist App 20030216051 - Chung, Henry Wei-Ming ;   et al. | 2003-11-20 |
Method of fabricating phase shift mask App 20030203285 - Chung, Henry Wei-Ming ;   et al. | 2003-10-30 |
Method for reducing dimensions between patterns on a photoresist App 20030082916 - Chung, Henry Wei-Ming ;   et al. | 2003-05-01 |
Advanced interconnection for integrated circuits App 20020151165 - Chung, Henry Wei-Ming | 2002-10-17 |
Interconnect structures for integrated circuits Grant 5,798,299 - Chung August 25, 1 | 1998-08-25 |
Method for forming a layer of metal silicide over the gates of a surface-channel CMOS device Grant 5,759,886 - Chung June 2, 1 | 1998-06-02 |
Integrated circuits with borderless vias Grant 5,757,077 - Chung , et al. May 26, 1 | 1998-05-26 |
Interconnect structures for integrated circuits Grant 5,666,007 - Chung September 9, 1 | 1997-09-09 |
Fabrication of integrated circuits with borderless vias Grant 5,656,543 - Chung August 12, 1 | 1997-08-12 |
Method of forming conductive region on silicon semiconductor material, and silicon semiconductor device with such region Grant 5,646,070 - Chung July 8, 1 | 1997-07-08 |