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Patent applications and USPTO patent grants for Chua; Choon Meng.The latest application filed is for "method and apparatus for cooling a semiconductor device".
Patent | Date |
---|---|
Method and apparatus for cooling a semiconductor device Grant 9,917,034 - Chua , et al. March 13, 2 | 2018-03-13 |
Method And Apparatus For Cooling A Semiconductor Device App 20160093554 - CHUA; Choon Meng ;   et al. | 2016-03-31 |
Apparatus and method for cooling a semiconductor device Grant 8,891,240 - Chua , et al. November 18, 2 | 2014-11-18 |
Wafer Stage App 20130241587 - Chua; Choon Meng ;   et al. | 2013-09-19 |
Wafer stage Grant 8,436,631 - Chua , et al. May 7, 2 | 2013-05-07 |
Method and system for measuring laser induced phenomena changes in a semiconductor device Grant 8,278,959 - Chua , et al. October 2, 2 | 2012-10-02 |
Apparatus And Method For Cooling A Semiconductor Device App 20120120599 - CHUA; Choon Meng ;   et al. | 2012-05-17 |
Solid immersion lens optics assembly Grant 8,072,699 - Koh , et al. December 6, 2 | 2011-12-06 |
Solid Immersion Lens Optics Assembly App 20100321678 - Koh; Lian Ser ;   et al. | 2010-12-23 |
Wafer Stage App 20100315617 - Chua; Choon Meng ;   et al. | 2010-12-16 |
Method And System For Measuring Laser Induced Phenomena Changes In A Semiconductor Device App 20100156451 - Chua; Choon Meng ;   et al. | 2010-06-24 |
Method of testing an electronic circuit and apparatus thereof Grant 7,623,982 - Chua , et al. November 24, 2 | 2009-11-24 |
Method and system for measuring laser induced phenomena changes in a semiconductor device Grant 7,456,032 - Chua , et al. November 25, 2 | 2008-11-25 |
Method and system for measuring laser induced phenomena changes in a semiconductor device App 20060284625 - Chua; Choon Meng ;   et al. | 2006-12-21 |
Laser beam induced phenomena detection Grant 6,897,664 - Bruce , et al. May 24, 2 | 2005-05-24 |
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