Chu; Yij Chieh

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chu; Yij Chieh.The latest application filed is for "method and system of compressing raw fabrication data for fault determination".

Company Profile

0.9.14

Chu; Yij Chieh - New Taipei TW
CHU; YIJ CHIEH - NEW TAIPEI CITY TW
Chu; Yij Chieh - Taipei County TW
Chu; Yij Chieh - Sanchong TW
Chu; Yij Chieh - Sanchong City TW
CHU; YIJ CHIEH - TAIPEI COUNTY 241 TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Fault detection method of semiconductor manufacturing processes and system architecture thereof Grant 8,756,028 - Chu , et al. June 17, 2	2014-06-17
Method for detecting variance in semiconductor processes Grant 8,649,990 - Chu , et al. February 11, 2	2014-02-11
Method and system of compressing raw fabrication data for fault determination Grant 8,510,610 - Chu , et al. August 13, 2	2013-08-13
Fault Detection Method Of Semiconductor Manufacturing Processes And System Architecture Thereof App 20120330591 - CHU; YIJ CHIEH ; et al.	2012-12-27
Method And System Of Compressing Raw Fabrication Data For Fault Determination App 20120331357 - CHU; YIJ CHIEH ; et al.	2012-12-27
Specification establishing method for controlling semiconductor process Grant 8,332,416 - Chen , et al. December 11, 2	2012-12-11
Method for assessing data worth for analyzing yield rate Grant 8,265,903 - Chu , et al. September 11, 2	2012-09-11
Method of adjusting wafer processing sequence Grant 8,244,500 - Tian , et al. August 14, 2	2012-08-14
Specification Establishing Method For Controlling Semiconductor Process App 20120102052 - CHEN; CHENG-HAO ; et al.	2012-04-26
Method For Detecting Variance In Semiconductor Processes App 20110257932 - CHU; YIJ CHIEH ; et al.	2011-10-20
Method For Planning Production Schedule Of Equipment And Associated Computer Readable Medium App 20110251708 - Chen; Wei-Jun ; et al.	2011-10-13
Method Of Searching For Key Semiconductor Operation With Randomization For Wafer Position App 20110153660 - CHU; YIJ CHIEH ; et al.	2011-06-23
Yield Loss Prediction Method And Associated Computer Readable Medium App 20110137595 - Chu; Yij-Chieh ; et al.	2011-06-09
Method for assessing data worth for analyzing yield rate App 20100268501 - Chu; Yij Chieh ; et al.	2010-10-21
Method Of Adjusting Wafer Processing Sequence App 20100256792 - TIAN; YUN-ZONG ; et al.	2010-10-07
Monitoring Method For Multi Tools App 20100223027 - CHU; YIJ CHIEH ; et al.	2010-09-02
Method Of Searching For Key Semiconductor Operation With Randomization For Wafer Position App 20100093114 - CHU; YIJ CHIEH ; et al.	2010-04-15
Method For Determining Tool's Production Quality App 20100049355 - CHU; YIJ CHIEH ; et al.	2010-02-25
Method For Detecting Variance In Semiconductor Processes App 20100010763 - CHU; YIJ CHIEH ; et al.	2010-01-14
Fault Detection And Classification Method For Wafer Acceptance Test Parameters App 20100004882 - CHU; YIJ CHIEH ; et al.	2010-01-07

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