Patent | Date |
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Semiconductor integrated circuit capable of controlling test modes without stopping test Grant 9,368,237 - An , et al. June 14, 2 | 2016-06-14 |
Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same Grant 9,025,410 - Chu May 5, 2 | 2015-05-05 |
Semiconductor memory device and method of testing the same Grant 8,917,572 - Chu December 23, 2 | 2014-12-23 |
Semiconductor memory device for improving repair efficiency Grant 8,767,489 - Lee , et al. July 1, 2 | 2014-07-01 |
Semiconductor Memory Devices And Semiconductor System Having Parameters, And Methods Of Testing The Same App 20140177314 - CHU; Shin Ho | 2014-06-26 |
Driver circuit of semiconductor apparatus and method for controlling the same Grant 8,749,270 - Lee , et al. June 10, 2 | 2014-06-10 |
Semiconductor Memory Device And Method Of Testing The Same App 20140050035 - CHU; Shin Ho | 2014-02-20 |
Address decoding method and semiconductor memory device using the same Grant 8,588,013 - Chu November 19, 2 | 2013-11-19 |
Address Decoding Method And Semiconductor Memory Device Using The Same App 20130114358 - CHU; Shin Ho | 2013-05-09 |
Semiconductor integrated circuit with multi test Grant 8,400,846 - Chu , et al. March 19, 2 | 2013-03-19 |
Data transfer circuit, method thereof, and memory device including data transfer circuit Grant 8,331,170 - Chu December 11, 2 | 2012-12-11 |
Semiconductor Memory Device App 20120257468 - LEE; Myung Hwan ;   et al. | 2012-10-11 |
Driver Circuit Of Semiconductor Apparatus And Method For Controlling The Same App 20120249214 - LEE; Myung Hwan ;   et al. | 2012-10-04 |
Thermal data output circuit and multi chip package using the same Grant 8,192,082 - Song , et al. June 5, 2 | 2012-06-05 |
Protection Circuit Of Semiconductor Apparatus App 20120081823 - CHU; Shin Ho | 2012-04-05 |
Semiconductor Integrated Circuit With Multi Test App 20120039137 - Chu; Shin Ho ;   et al. | 2012-02-16 |
Data Transfer Circuit, Method Thereof, And Memory Device Including Data Transfer Circuit App 20110292746 - Chu; Shin-Ho | 2011-12-01 |
Semiconductor integrated circuit with multi test Grant 8,045,408 - Chu , et al. October 25, 2 | 2011-10-25 |
Anti-fuse repair control circuit and semiconductor device including DRAM having the same Grant 8,023,347 - Chu , et al. September 20, 2 | 2011-09-20 |
Self refresh operation of semiconductor memory device Grant 8,000,163 - Ahn , et al. August 16, 2 | 2011-08-16 |
Self refresh operation of semiconductor memory device Grant 8,000,164 - Ahn , et al. August 16, 2 | 2011-08-16 |
Fuse circuit for semiconductor integrated circuit and control method of the same Grant 7,940,115 - An , et al. May 10, 2 | 2011-05-10 |
Anti-fuse repair control circuit for preventing stress on circuit parts Grant 7,902,902 - Chu , et al. March 8, 2 | 2011-03-08 |
Internal voltage generation circuit Grant 7,800,431 - Chu September 21, 2 | 2010-09-21 |
Semiconductor memory apparatus Grant 7,773,402 - Park , et al. August 10, 2 | 2010-08-10 |
Self Refresh Operation Of Semiconductor Memory Device App 20100188915 - Ahn; Jin-Hong ;   et al. | 2010-07-29 |
Self Refresh Operation Of Semiconductor Memory Device App 20100188914 - Ahn; Jin-Hong ;   et al. | 2010-07-29 |
Anti-fuse Repair Control Circuit And Semiconductor Device Including Dram Having The Same App 20100142299 - CHU; Shin Ho ;   et al. | 2010-06-10 |
Self refresh operation of semiconductor memory device Grant 7,710,809 - Ahn , et al. May 4, 2 | 2010-05-04 |
Semiconductor package Grant 7,693,003 - Chu April 6, 2 | 2010-04-06 |
Anti-fuse repair control circuit and semiconductor device including DRAM having the same Grant 7,688,663 - Chu , et al. March 30, 2 | 2010-03-30 |
Semiconductor Integrated Circuit Capable Of Controlling Test Modes Without Stopping Test App 20100032669 - AN; Sun Mo ;   et al. | 2010-02-11 |
Deep power down mode control circuit Grant 7,606,105 - Chu October 20, 2 | 2009-10-20 |
Semiconductor Memory Apparatus App 20090251985 - PARK; Sang II ;   et al. | 2009-10-08 |
Semiconductor Integrated Circuit, Fuse Circuit For Semiconductor Integrated Circuit And Control Method Of The Same App 20090230986 - An; Sun Mo ;   et al. | 2009-09-17 |
Self refresh control device Grant 7,580,310 - Chu August 25, 2 | 2009-08-25 |
Semiconductor Integrated Circuit With Multi Test App 20090207673 - Chu; Shin Ho ;   et al. | 2009-08-20 |
Thermal data output circuit and multi chip package using the same App 20090168840 - Song; Ho Uk ;   et al. | 2009-07-02 |
Semiconductor memory apparatus Grant 7,554,871 - Park , et al. June 30, 2 | 2009-06-30 |
Anti-fuse Repair Control Circuit And Semiconductor Device Including Dram Having The Same App 20090141577 - Chu; Shin Ho ;   et al. | 2009-06-04 |
Anti-fuse Repair Control Circuit For Preventing Stress On Circuit Parts App 20090134935 - Chu; Shin Ho ;   et al. | 2009-05-28 |
Semiconductor Integrated Circuit And Multi Test Method Thereof App 20090059691 - Chu; Shin Ho ;   et al. | 2009-03-05 |
Multi-column Decoder Stress Test Circuit App 20090046524 - Chu; Shin-Ho ;   et al. | 2009-02-19 |
TRAS adjusting circuit for self-refresh mode in a semiconductor device Grant 7,447,097 - Hwang , et al. November 4, 2 | 2008-11-04 |
Semiconductor package App 20080186798 - Chu; Shin Ho | 2008-08-07 |
Internal voltage generation circuit App 20080159047 - Chu; Shin Ho | 2008-07-03 |
Deep power down mode control circuit App 20080123460 - Chu; Shin Ho | 2008-05-29 |
Buffer Grant 7,368,953 - Chu , et al. May 6, 2 | 2008-05-06 |
Self refresh control device App 20080101134 - Chu; Shin-Ho | 2008-05-01 |
Self refresh control device Grant 7,327,626 - Chu February 5, 2 | 2008-02-05 |
Semiconductor memory apparatus App 20070285998 - Park; Sang Il ;   et al. | 2007-12-13 |
TRAS adjusting circuit for self-refresh mode in a semiconductor device App 20070274146 - Hwang; Mi Hyun ;   et al. | 2007-11-29 |
Self refresh operation of semiconductor memory device App 20070242547 - Ahn; Jin-Hong ;   et al. | 2007-10-18 |
Wordline enable circuit in semiconductor memory device and method thereof Grant 7,274,619 - Lee , et al. September 25, 2 | 2007-09-25 |
Buffer App 20070080722 - Chu; Shin Ho ;   et al. | 2007-04-12 |
Buffer App 20070080719 - Chu; Shin Ho ;   et al. | 2007-04-12 |
Self refresh control device App 20070041252 - Chu; Shin-Ho | 2007-02-22 |
Memory device including parallel test circuit Grant 7,126,865 - Hong , et al. October 24, 2 | 2006-10-24 |
Input buffer circuit of semiconductor memory device App 20060227626 - Chu; Shin Ho ;   et al. | 2006-10-12 |
Wordline enable circuit in semiconductor memory device and method thereof App 20060215475 - Lee; Jong-Won ;   et al. | 2006-09-28 |
Memory device including parallel test circuit App 20050195666 - Hong, Yun Seok ;   et al. | 2005-09-08 |
Apparatus and method for controlling data strobe signal in DDR SDRAM Grant 6,215,710 - Han , et al. April 10, 2 | 2001-04-10 |