| Patent | Date |
|---|
Motor Controller, Motor Control Method And Computer Program Product For Vehicle Assist Control
App 20220311363 - LIN; YU-TING ; et al. | 2022-09-29 |
Rotatable cushioning pick-and-place device
Grant 11,400,605 - Chen , et al. August 2, 2 | 2022-08-02 |
Automatic mounting and demounting device and system for motor testing platform
Grant 11,391,646 - Chen , et al. July 19, 2 | 2022-07-19 |
Electronic Load Apparatus
App 20220206080 - CHEN; Wen-Chung ; et al. | 2022-06-30 |
Low-thermal resistance pressing device for a socket
App 20220206059 - HUANG; Ming Cheng ; et al. | 2022-06-30 |
Laser Diode Testing System And Laser Diode Testing Method
App 20220209493 - WANG; Sheng-Hung ; et al. | 2022-06-30 |
Optical Inspection Apparatus In Semiconductor Process System
App 20220208618 - PAN; SHIH-YAO ; et al. | 2022-06-30 |
Chip-fixing Device For A Socket
App 20220200185 - WU; HUI-JUNG ; et al. | 2022-06-23 |
Probe Apparatus
App 20220178967 - CHANG; CHIN-YUAN ; et al. | 2022-06-09 |
Pitch-variable Battery Fixture And Battery Cell Formation Apparatus Having The Same
App 20220166076 - CHIU; CHIH HSIEN ; et al. | 2022-05-26 |
Chip Transfer Device Capable Of Floatingly Positioning A Chip And Method For Floatingly Positioning A Chip
App 20220157639 - CHEN; CHIEN-MING ; et al. | 2022-05-19 |
Sliding test device for electronic components
Grant 11,333,704 - Ouyang , et al. May 17, 2 | 2022-05-17 |
Fluorescence Detection System
App 20220136970 - CHEN; HSUAN-AN ; et al. | 2022-05-05 |
Electronic load device and heat-dissipating load module
Grant 11,324,109 - Huang , et al. May 3, 2 | 2022-05-03 |
Condensing system
Grant 11,300,491 - Tsai , et al. April 12, 2 | 2022-04-12 |
Separate microscopy system and adjusting method thereof
Grant 11,269,170 - Pan , et al. March 8, 2 | 2022-03-08 |
Wafer Inspection System And Wafer Inspection Equipment Thereof
App 20220034956 - CHEN; WEI-CHIH ; et al. | 2022-02-03 |
Optical detecting device and calibrating method
Grant 11,209,371 - Liu , et al. December 28, 2 | 2021-12-28 |
Locking mechanism for a press head and electronic device testing apparatus comprising the same
Grant 11,169,178 - Ouyang , et al. November 9, 2 | 2021-11-09 |
Battery testing device and method thereof
Grant 11,156,669 - Chang , et al. October 26, 2 | 2021-10-26 |
Rotating buffer station for a chip
Grant 11,143,640 - Chen , et al. October 12, 2 | 2021-10-12 |
Image inspection method
Grant 11,080,860 - Chen , et al. August 3, 2 | 2021-08-03 |
Electronic load apparatus
Grant 11,073,852 - Hung , et al. July 27, 2 | 2021-07-27 |
Apparatus and method for a high temperature test and a low temperature test and configured to maintain an electronic component under test near a test temperature
Grant 11,061,067 - Wu July 13, 2 | 2021-07-13 |
Electronic Load Apparatus
App 20210200251 - Hung; Chun-Sheng ; et al. | 2021-07-01 |
Rotatable Cushioning Pick-and-place Device
App 20210197405 - CHEN; Chien-Ming ; et al. | 2021-07-01 |
Locking Mechanism For A Press Head And Electronic Device Testing Apparatus Comprising The Same
App 20210199690 - OUYANG; Chin-Yi ; et al. | 2021-07-01 |
Electronic Load Device And Heat-dissipating Load Module
App 20210153336 - HUANG; Chien-Hsing ; et al. | 2021-05-20 |
Automatic fluorescence detection system
Grant 10,989,660 - Chu , et al. April 27, 2 | 2021-04-27 |
Fixture assembly for testing surface emitting laser diodes and testing apparatus having the same
Grant 10,965,096 - Hopkins March 30, 2 | 2021-03-30 |
Test apparatus for testing electronic device
Grant 10,948,518 - Chen , et al. March 16, 2 | 2021-03-16 |
Battery formation system and probe supporting structure thereof
Grant 10,910,627 - Hsu , et al. February 2, 2 | 2021-02-02 |
Fixture assembly for testing edge-emitting laser diodes and testing apparatus having the same
Grant 10,903,618 - Hopkins January 26, 2 | 2021-01-26 |
Automatic Mounting And Demounting Device And System For Motor Testing Platform
App 20210010901 - CHEN; MING-YEN ; et al. | 2021-01-14 |
Testing fixture, testing system for cell temperature probe and method for testing cell temperature probe
Grant 10,890,624 - Lin , et al. January 12, 2 | 2021-01-12 |
Modular pressing device capable of generating stage downward forces and electronic device testing apparatus comprising the same
Grant 10,879,097 - Wu , et al. December 29, 2 | 2020-12-29 |
Probe pin alignment apparatus
Grant 10,845,386 - Wang , et al. November 24, 2 | 2020-11-24 |
Voltage dividing resistor
Grant 10,825,588 - Liu , et al. November 3, 2 | 2020-11-03 |
Battery cell tray
Grant 10,811,720 - Hsu , et al. October 20, 2 | 2020-10-20 |
Testing device and testing method with spike protection
Grant 10,802,070 - Chu , et al. October 13, 2 | 2020-10-13 |
Fixture Assembly For Testing Edge-emitting Laser Diodes And Testing Apparatus Having The Same
App 20200303895 - Hopkins; James E. | 2020-09-24 |
Fixture Assembly For Testing Surface Emitting Laser Diodes And Testing Apparatus Having The Same
App 20200303894 - Hopkins; James E. | 2020-09-24 |
Contact detection circuit of four-terminal measurement device
Grant 10,718,635 - Chen , et al. | 2020-07-21 |
Electrical probe
Grant 10,712,366 - Hsu , et al. | 2020-07-14 |
Separate Microscopy System And Adjusting Method Thereof
App 20200209603 - PAN; Shih-Yao ; et al. | 2020-07-02 |
Image Inspection Method
App 20200211199 - CHEN; Ting-Wei ; et al. | 2020-07-02 |
Optical Detecting Device And Calibrating Method
App 20200191724 - LIU; Yu-Hsin ; et al. | 2020-06-18 |
Method for testing semi-finished battery cell
Grant 10,673,104 - Tsai , et al. | 2020-06-02 |
Electrical probe structure
Grant 10,670,627 - Liu , et al. | 2020-06-02 |
Condensing System
App 20200166445 - TSAI; Cheng-Ting ; et al. | 2020-05-28 |
Battery cell formation device and probe supporting structure thereof
Grant 10,665,906 - Hsu , et al. | 2020-05-26 |
Surface Measuring Device And Surface Measuring Method
App 20200158502 - TSAI; Cheng-Ting ; et al. | 2020-05-21 |
Probe Pin Alignment Apparatus
App 20200132724 - WANG; Yu-Yen ; et al. | 2020-04-30 |
Sliding test device for electronic components
App 20200081060 - Ouyang; Chin-Yi ; et al. | 2020-03-12 |
Rotating buffer station for a chip
App 20200057037 - CHEN; YUNG-CHIH ; et al. | 2020-02-20 |
Apparatus And Method For A High Temperature Test And A Low Temperature Test
App 20200033399 - WU; Xin-Yi | 2020-01-30 |
Absorption testing apparatus
Grant 10,527,671 - Cheng J | 2020-01-07 |
Dew resistant module for test socket and electronic component testing device having the same
Grant 10,520,528 - Wu , et al. Dec | 2019-12-31 |
Method and device for testing air tightness
Grant 10,508,969 - Cheng , et al. Dec | 2019-12-17 |
Test apparatus for testing electronic device
App 20190361047 - CHEN; Chien-Ming ; et al. | 2019-11-28 |
Device for pressing electronic component with different downward forces
Grant 10,488,459 - Wu , et al. Nov | 2019-11-26 |
Method for checking a wire connection
Grant 10,481,209 - Wang , et al. Nov | 2019-11-19 |
Optical measuring device
Grant 10,436,636 - Chang O | 2019-10-08 |
Surface measurement system
Grant 10,436,580 - Chiu , et al. O | 2019-10-08 |
Battery Cell Tray
App 20190305352 - HSU; Hsu-Chang ; et al. | 2019-10-03 |
Inspection method and inspection system of solar cell
Grant 10,411,646 - Tsai , et al. Sept | 2019-09-10 |
Detection Device
App 20190257762 - PAN; Shih-Yao ; et al. | 2019-08-22 |
Automatic Fluorescence Detection System
App 20190257753 - CHU; Chien-Hsun ; et al. | 2019-08-22 |
Electrical Probe
App 20190195911 - HSU; Hsu-Chang ; et al. | 2019-06-27 |
Electrical Probe Structure
App 20190187176 - LIU; Mao-Sheng ; et al. | 2019-06-20 |
Modular Pressing Device Capable Of Generating Stage Downward Forces And Electronic Device Testing Apparatus Comprising The Same
App 20190172740 - WU; Chi-Chen ; et al. | 2019-06-06 |
Temperature-controlled module for electronic devices and testing apparatus provided with the same
Grant 10,309,986 - Chien , et al. | 2019-06-04 |
Testing Fixture, Testing System For Cell Temperature Probe And Method For Testing Cell Temperature Probe
App 20190162795 - LIN; Chuan-Tse ; et al. | 2019-05-30 |
Surface Measurement System
App 20190145762 - CHIU; Yi-Chang ; et al. | 2019-05-16 |
Output control method for a digital controller of a source measure unit
Grant 10,291,116 - Chen , et al. | 2019-05-14 |
Battery Formation System And Probe Supporting Structure Thereof
App 20190123335 - HSU; Hsu-Chang ; et al. | 2019-04-25 |
Optical Measuring Device
App 20190113384 - CHANG; Wei-Yao | 2019-04-18 |
Electrical probe with a probe head and contacting pins
Grant 10,254,310 - Liu , et al. | 2019-04-09 |
Electronic device testing apparatus with locking mechanism for pressing header and socket plate
Grant 10,254,308 - Chen | 2019-04-09 |
Battery Cell Formation Device And Probe Supporting Structure Thereof
App 20190067759 - HSU; Hsu-Chang ; et al. | 2019-02-28 |
Clamp-type probe device
Grant 10,215,812 - Chen , et al. Feb | 2019-02-26 |
Inspection Method And Inspection System Of Solar Cell
App 20180375470 - TSAI; Cheng-Ting ; et al. | 2018-12-27 |
Method For Testing Semi-finished Battery Cell
App 20180323481 - TSAI; Chih-Ming ; et al. | 2018-11-08 |
Testing Device And Testing Method With Spike Protection
App 20180306856 - CHU; Ching-Hua ; et al. | 2018-10-25 |
Device For Pressing Electronic Component With Different Downward Forces
App 20180292452 - WU; Chi-Chen ; et al. | 2018-10-11 |
Support apparatus
Grant 10,034,410 - Chuang , et al. July 24, 2 | 2018-07-24 |
Method And Device For Testing Air Tightness
App 20180188132 - CHENG; Po-Kai ; et al. | 2018-07-05 |
Method For Checking A Wire Connection
App 20180180678 - WANG; Chih-Hsien ; et al. | 2018-06-28 |
Absorption Testing Apparatus
App 20180172762 - CHENG; Po-Kai | 2018-06-21 |
Dual loop type temperature control module and electronic device testing apparatus provided with the same
Grant 9,983,259 - Wu , et al. May 29, 2 | 2018-05-29 |
Dew Resistant Module For Test Socket And Electronic Component Testing Device Having The Same
App 20180113151 - WU; Xin-Yi ; et al. | 2018-04-26 |
Measurement fixture for a battery cell
Grant 9,954,255 - Hopkins April 24, 2 | 2018-04-24 |
Output Control Method For Controller
App 20180048228 - CHEN; Tsz-Lang ; et al. | 2018-02-15 |
Contact Detection Circuit Of Four-terminal Measurement Device
App 20180045537 - CHEN; Tsz-Lang ; et al. | 2018-02-15 |
Battery Testing Device And Method Thereof
App 20180031637 - TSAI; Chih-Ming | 2018-02-01 |
Temperature-controlled Module For Electronic Devices And Testing Apparatus Provided With The Same
App 20180024162 - CHIEN; Chia-Hung ; et al. | 2018-01-25 |
Clamp-type Probe Device
App 20180011146 - CHEN; Peng-Fei ; et al. | 2018-01-11 |
Electrical Probe And Jig For The Same
App 20170370965 - HSU; Hsu-Chang ; et al. | 2017-12-28 |
Calibration board for calibrating signal delays of test channels in an automatic test equipment and timing calibration method thereof
Grant 9,841,487 - Chen , et al. December 12, 2 | 2017-12-12 |
Automatic test system and method
Grant 9,841,737 - Lu , et al. December 12, 2 | 2017-12-12 |
Battery simulator
Grant 9,823,295 - Wu , et al. November 21, 2 | 2017-11-21 |
Electrical Probe
App 20170322235 - LIU; Mao-Sheng ; et al. | 2017-11-09 |
Electronic device testing apparatus with locking mechanism for pressing header and socket plate
App 20170292973 - CHEN; Chien-Ming | 2017-10-12 |
Dual loop type temperature control module and electronic device testing apparatus provided with the same
App 20170227599 - WU; Xin-Yi ; et al. | 2017-08-10 |
Inspection system and method for obtaining an adjusted light intensity image
Grant 9,706,098 - Weng , et al. July 11, 2 | 2017-07-11 |
Pulse Generating Apparatus And Calibrating Method Thereof
App 20170168100 - CHANG; Cheng-Hsien ; et al. | 2017-06-15 |
Apparatus for testing a package-on-package semiconductor device
Grant 9,678,158 - Chen June 13, 2 | 2017-06-13 |
Radiator module system for automatic test equipment
Grant 9,658,283 - Wu , et al. May 23, 2 | 2017-05-23 |
Clock generating device
Grant 9,647,650 - Chang , et al. May 9, 2 | 2017-05-09 |
Test system with rotational test arms for testing semiconductor components
Grant 9,638,740 - Chen , et al. May 2, 2 | 2017-05-02 |
Measurement Fixture For A Battery Cell
App 20170108326 - HOPKINS; James E. | 2017-04-20 |
Probe
App 20170045552 - LIU; Mao-Sheng ; et al. | 2017-02-16 |
Heating furnace
Grant 9,568,245 - Kuo , et al. February 14, 2 | 2017-02-14 |
Apparatus for testing package-on-package semiconductor device and method for testing the same
Grant 9,519,024 - Chen December 13, 2 | 2016-12-13 |
Battery Simulator
App 20160341787 - WU; Chien-Ming ; et al. | 2016-11-24 |
Temperature control equipment
Grant 9,494,353 - Yu , et al. November 15, 2 | 2016-11-15 |
Test apparatus with dry environment
Grant 9,470,749 - Wu , et al. October 18, 2 | 2016-10-18 |
Automatic Test System And Method
App 20160291080 - LU; Chih-Cherng ; et al. | 2016-10-06 |
Testing apparatus for light emitting diodes
Grant 9,429,617 - Tseng , et al. August 30, 2 | 2016-08-30 |
Clock Generating Device
App 20160191032 - CHANG; Cheng-Hsien ; et al. | 2016-06-30 |
Inspection System and Method for Obtaining an Adjusted Light Intensity Image
App 20160165110 - WENG; Yi-Lung ; et al. | 2016-06-09 |
Temperature control module for a socket
Grant 9,353,995 - Wu , et al. May 31, 2 | 2016-05-31 |
Test device for testing a PoP stacked-chip
Grant 9,347,989 - Chen , et al. May 24, 2 | 2016-05-24 |
Calibration Board And Timing Calibration Method Thereof
App 20160124066 - CHEN; Hou-Chun ; et al. | 2016-05-05 |
Tray for holding pouch-type batteries
Grant 9,318,730 - Fan , et al. April 19, 2 | 2016-04-19 |
Temperature controller and thermal control platform
Grant 9,274,532 - Liu , et al. March 1, 2 | 2016-03-01 |
Testing system for testing semiconductor package stacking chips and semiconductor automatic tester thereof
Grant 9,250,292 - Chen February 2, 2 | 2016-02-02 |
Solar cell testing system, solar cell testing method, and multifunctional testing light source
Grant 9,234,933 - Yang , et al. January 12, 2 | 2016-01-12 |
Light-emitting module and driving method thereof
Grant 9,232,600 - Hu , et al. January 5, 2 | 2016-01-05 |
Heating Furnace
App 20150323257 - KUO; Hsiu-Wei ; et al. | 2015-11-12 |
Apparatus For Testing A Package-On-Package Semiconductor Device
App 20150260793 - CHEN; Chien-Ming | 2015-09-17 |
Method for detecting a surface pattern of a solar cell
Grant 9,116,135 - Cheng , et al. August 25, 2 | 2015-08-25 |
Apparatus for Testing Package-on-Package Semiconductor Device and Method for Testing the Same
App 20150226794 - CHEN; Chien-Ming | 2015-08-13 |
Radiator Module System For Automatic Test Equipment
App 20150198659 - WU; XIN-YI ; et al. | 2015-07-16 |
Light-emitting Module And Driving Method Thereof
App 20150181664 - HU; Che-Cheng ; et al. | 2015-06-25 |
Automatic Retest Method For System-level Ic Test Equipment And Ic Test Equipment Using Same
App 20150066414 - Ouyang; Chin-Yi ; et al. | 2015-03-05 |
Test Apparatus with Sector Conveyance Device
App 20150022231 - Lee; Yi-Chiao ; et al. | 2015-01-22 |
Wide Range Of Temperature Control Equipment
App 20150007973 - YU; Ben-Mou ; et al. | 2015-01-08 |
Temperature Control Module For A Socket
App 20140368999 - Wu; Xin-Yi ; et al. | 2014-12-18 |
Burn-in testing apparatus
Grant 8,779,788 - Chen , et al. July 15, 2 | 2014-07-15 |
Total luminous flux measurement system and total luminous flux measuring method
Grant 8,773,655 - Cheng , et al. July 8, 2 | 2014-07-08 |
Test Apparatus With Dry Environment
App 20140182397 - WU; Xin-Yi ; et al. | 2014-07-03 |
Test Table With Dry Environment
App 20140176170 - WU; Xin-Yi ; et al. | 2014-06-26 |
Test System With Rotational Test Arms For Testing Semiconductor Components
App 20140103954 - CHEN; Chien-Ming ; et al. | 2014-04-17 |
Optical Detection System
App 20140043310 - Pan; Ding-Hsiang ; et al. | 2014-02-13 |
Imaging apparatus and method thereof
Grant 8,638,445 - Lin , et al. January 28, 2 | 2014-01-28 |
Total Luminous Flux Measurement System And Total Luminous Flux Measuring Method
App 20130321794 - CHENG; HSU-TING ; et al. | 2013-12-05 |
Method of constructing light-measuring look-up table, light-measuring method, and light-measuring system
Grant 8,599,380 - Wang , et al. December 3, 2 | 2013-12-03 |
Testing system for Testing Semiconductor Package stacking Chips and Semiconductor Automatic Tester thereof
App 20130293252 - CHEN; Chien-Ming | 2013-11-07 |
Test Device For Testing A Pop Stacked-chip
App 20130293254 - CHEN; Chien-Ming ; et al. | 2013-11-07 |
Image Capturing Device
App 20130271640 - YUEH-HUNG; CHENG ; et al. | 2013-10-17 |
Solar Cell Testing System, Solar Cell Testing Method, And Multifunctional Testing Light Source
App 20130265077 - YANG; Lan-Sheng ; et al. | 2013-10-10 |
Methods Of Calibrating Color Measurement Devices
App 20130250299 - WENG; Yi-Lung ; et al. | 2013-09-26 |
Light emitting component measuring system and the method thereof
Grant 8,525,996 - Cheng , et al. September 3, 2 | 2013-09-03 |
Method For Detecting A Surface Pattern Of A Solar Cell
App 20130223747 - CHENG; WEN-WEI ; et al. | 2013-08-29 |
Distance adjustment system for use in solar wafer inspection machine and inspection machine provided with same
Grant 8,461,857 - Lai June 11, 2 | 2013-06-11 |
Solar Cell Inspection Method And Apparatus Thereof
App 20130114072 - WANG; TSUN-YI ; et al. | 2013-05-09 |
Testing Apparatus For Light Emitting Diodes
App 20130015859 - Tseng; I-Shih ; et al. | 2013-01-17 |
Electrical Connecting Device
App 20130009660 - FAN; Chiang-Cheng ; et al. | 2013-01-10 |
Burn-in Testing Apparatus
App 20120326740 - CHEN; CHI-REN ; et al. | 2012-12-27 |
Optical Measurement System And The Device Thereof
App 20120320369 - Cheng; Hsu-Ting ; et al. | 2012-12-20 |
Tray
App 20120312719 - FAN; Chiang-Cheng ; et al. | 2012-12-13 |
Light Emitting Component Measuring System and The Method Thereof
App 20120250021 - Cheng; Hsu-Ting ; et al. | 2012-10-04 |
Light Source With Uniform Chromaticity And Luminance And Color Sensor Provided With Same
App 20120182549 - Wang; Tsung-I ; et al. | 2012-07-19 |
Battery charging and discharging apparatus and method
Grant 8,222,867 - Wang , et al. July 17, 2 | 2012-07-17 |
Process And Apparatus For Measuring Spectral Response Of Solar Cell, And Process For Compensating Decay Of Light Source
App 20120101782 - Wang; Tsung-I ; et al. | 2012-04-26 |
Distance Adjustment System For Use In Solar Wafer Inspection Machine And Inspection Machine Provided With Same
App 20120013897 - Lai; Chia-Hung | 2012-01-19 |
Test Fixture For Testing Semiconductor Die With Its Loading Member Maintained Flat Throughout The Test
App 20120013348 - Chen; Cheng-Huiung ; et al. | 2012-01-19 |
Imaging Apparatus And Method Thereof
App 20110317169 - LIN; YU-HSUAN ; et al. | 2011-12-29 |
Device for simulating rectified constant impedance load and method thereof
Grant 8,044,678 - Kao , et al. October 25, 2 | 2011-10-25 |
Monochromatic Measurement System
App 20110188036 - Pan; Ding-Hsiang ; et al. | 2011-08-04 |
Battery Charging/Discharging System
App 20110175575 - Wu; Chen-Yuan ; et al. | 2011-07-21 |
Electronic load device for power supply product to be tested and method for regulating bandwidth thereof
Grant 7,933,732 - Kao , et al. April 26, 2 | 2011-04-26 |
Electronic Load For Simulating Characteristics Of An Led And Method For Operating The Same
App 20110066417 - TSOU; MING-YING ; et al. | 2011-03-17 |
System and method for testing light-emitting devices
Grant 7,804,589 - Tseng , et al. September 28, 2 | 2010-09-28 |
Battery Charging And Discharging Apparatus And Method
App 20100201324 - Wang; Yao-Nan ; et al. | 2010-08-12 |
System And Method For Testing Light-emitting Devices
App 20090309606 - TSENG; I-SHIH ; et al. | 2009-12-17 |
Photosensor testing device with built-in light source and tester provided with said device
Grant 7,626,403 - Ou , et al. December 1, 2 | 2009-12-01 |
Optical measuring system with a high-speed optical sensing device enabling to sense luminous intensity and chromaticity
Grant 7,626,688 - Ou , et al. December 1, 2 | 2009-12-01 |
Optical image system surface resolution calibration method
Grant 7,580,590 - Lin , et al. August 25, 2 | 2009-08-25 |
Top mount surface airflow heatsink and top mount heatsink component device
App 20090161311 - Tseng; I-Shih | 2009-06-25 |
Method for testing system-in-package devices
Grant 7,545,158 - Hopkins , et al. June 9, 2 | 2009-06-09 |
Apparatus for testing system-in-package devices
Grant 7,535,214 - Hopkins , et al. May 19, 2 | 2009-05-19 |
Test circuits of an apparatus for testing micro SD devices
Grant 7,518,357 - Hopkins , et al. April 14, 2 | 2009-04-14 |
Apparatus for testing system-in-package devices
Grant 7,518,356 - Hopkins , et al. April 14, 2 | 2009-04-14 |
Test circuits of an apparatus for testing system-in-package devices
Grant 7,514,914 - Hopkins , et al. April 7, 2 | 2009-04-07 |
Method for testing plurality of system-in-package devices using plurality of test circuits
Grant 7,489,155 - Hopkins , et al. February 10, 2 | 2009-02-10 |
Surface profile measuring method
Grant 7,472,042 - Chang , et al. December 30, 2 | 2008-12-30 |
Optical measuring system with a high-speed optical sensing device abling to sense luminous intensity and chromaticity
App 20080297771 - Ou; Tsung-Hsien ; et al. | 2008-12-04 |
Surface airflow heatsink device and the heatsink device components
App 20080266797 - Tseng; I-Shih | 2008-10-30 |
Method for testing micro SD devices using each test circuits
Grant 7,443,190 - Hopkins , et al. October 28, 2 | 2008-10-28 |
Integrated interference scanning method
Grant 7,423,764 - Liao , et al. September 9, 2 | 2008-09-09 |
Automatic testing method to be used by an IC testing system equipped with multiple testing sites
App 20080133166 - Lai; Angus | 2008-06-05 |
Photosensor testing device with built-in light source and tester provided with said device
App 20080129304 - Ou; Joy ; et al. | 2008-06-05 |
Method for automatic dispatching IP addresses to each testing apparatus in a testing system and the system
App 20080109541 - Hsu; Warren | 2008-05-08 |
Surface profile measuring method and an apparatus thereof
App 20080013100 - Chang; Hung-Chang ; et al. | 2008-01-17 |
Repairing method for dark areas on a surface profile and a surface profile measuring method
App 20080013101 - Lin; Yaomin ; et al. | 2008-01-17 |
Interferometric apparatus and method for surface profile detection
Grant 7,277,181 - Lin October 2, 2 | 2007-10-02 |
Interference measurement system self-alignment method
App 20070127036 - Liao; Chien-Chong ; et al. | 2007-06-07 |
Integrated interference scanning method
App 20070097379 - Liao; Chieh-Cheng ; et al. | 2007-05-03 |
Automatic focusing method
App 20070077048 - Liao; Chieh-Cheng ; et al. | 2007-04-05 |
Optical image system surface resolution calibration method
App 20070076170 - Lin; Yao-Min ; et al. | 2007-04-05 |
Apparatus for feature detection
Grant 7,193,697 - Sung , et al. March 20, 2 | 2007-03-20 |
Apparatus for feature detection
App 20070019186 - Sung; Hsin-Yueh ; et al. | 2007-01-25 |
Device for signal transmission between a plurality of devices under test and a testing equipment
App 20060212246 - Chuang; Charles ; et al. | 2006-09-21 |
Optical spectrometer
App 20060132768 - Chuang; Charles ; et al. | 2006-06-22 |
Process and device of high voltage test with detecting function for short/open circuit
App 20060114001 - Wang; Yauo-Nan ; et al. | 2006-06-01 |
System and method for automated testing of optical characteristics of a light-emitting element
App 20060022124 - Chuang; Charles | 2006-02-02 |
Digital jitter synthesizer
App 20060009938 - Roger; Tseng ; et al. | 2006-01-12 |
Interferometric apparatus and method for surface profile detection
App 20050248770 - Lin, Yaomin | 2005-11-10 |
Portable chassis
Grant D511,161 - Lin , et al. November 1, 2 | 2005-11-01 |
Method and circuit for conducting AC offset current compensation and testing device using the same
App 20050231188 - Wang, Yauo-Nan ; et al. | 2005-10-20 |
Method and system for measuring characteristics of liquid crystal display driver chips
Grant 6,925,415 - Tseng , et al. August 2, 2 | 2005-08-02 |
Trace-following powered amplifier
App 20050083121 - Tsai, Ming Hor ; et al. | 2005-04-21 |
Variable chassis for interface card modules
App 20050078437 - Chuang, Chia-Ming ; et al. | 2005-04-14 |
Floating impedance high voltage simultaneously test circuit and test method thereof
App 20050073319 - Wang, Yauo-Nan ; et al. | 2005-04-07 |
Method and system for multi-port synchronous high voltage testing
Grant 6,674,290 - Wang January 6, 2 | 2004-01-06 |
Timing generating apparatus with self-calibrating capability
Grant 6,304,119 - Tseng , et al. October 16, 2 | 2001-10-16 |
Apparatus for charging and discharging a battery device
Grant 6,259,230 - Chou July 10, 2 | 2001-07-10 |
Uninterruptible power supply unit
Grant D390,532 - Su February 10, 1 | 1998-02-10 |
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