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Patent applications and USPTO patent grants for Christiansen; Cathryn J..The latest application filed is for "ic structure with interdigitated conductive elements between metal guard structures".
Patent | Date |
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IC structure with interdigitated conductive elements between metal guard structures Grant 10,770,407 - Wu , et al. Sep | 2020-09-08 |
Ic Structure With Interdigitated Conductive Elements Between Metal Guard Structures App 20200219826 - Wu; Zhuojie ;   et al. | 2020-07-09 |
Parallel test structure Grant 10,475,677 - Shen , et al. Nov | 2019-11-12 |
Parallel Test Structure App 20190067056 - Shen; Tian ;   et al. | 2019-02-28 |
Integrated circuit structure with continuous metal crack stop Grant 10,109,599 - Christiansen , et al. October 23, 2 | 2018-10-23 |
Integrated Circuit Structure With Continuous Metal Crack Stop App 20180174982 - Christiansen; Cathryn J. ;   et al. | 2018-06-21 |
Compound Resistor Structure For Semiconductor Device App 20180102318 - Christiansen; Cathryn J. ;   et al. | 2018-04-12 |
Electromigration testing of interconnect analogues having bottom-connected sensory pins Grant 9,851,397 - Chen , et al. December 26, 2 | 2017-12-26 |
Edge compression layers Grant 9,831,194 - Lee , et al. November 28, 2 | 2017-11-28 |
Wiring structures Grant 9,780,031 - Chen , et al. October 3, 2 | 2017-10-03 |
Interconnect structures with variable dopant levels Grant 9,768,065 - Wang , et al. September 19, 2 | 2017-09-19 |
Titanium tungsten liner used with copper interconnects Grant 9,685,370 - Chapple-Sokol , et al. June 20, 2 | 2017-06-20 |
Electromigration Testing Of Interconnect Analogues Having Bottom-connected Sensory Pins App 20160258998 - Chen; Fen ;   et al. | 2016-09-08 |
Integrated circuit (IC) test structure with monitor chain and test wires Grant 9,435,852 - Kim , et al. September 6, 2 | 2016-09-06 |
Titanium Tungsten Liner Used With Copper Interconnects App 20160181151 - Chapple-Sokol; Jonathan D. ;   et al. | 2016-06-23 |
Wiring Structures App 20160071790 - CHEN; Fen ;   et al. | 2016-03-10 |
Method of self-correcting power grid for semiconductor structures Grant 9,214,427 - Christiansen , et al. December 15, 2 | 2015-12-15 |
Method Ofself-correcting A Power Grid For Semiconductor Structures App 20150243601 - Christiansen; Cathryn J. ;   et al. | 2015-08-27 |
Alternating Open-ended Via Chains For Testing Via Formation And Dielectric Integrity App 20150221567 - Chen; Fen ;   et al. | 2015-08-06 |
Self-correcting power grid for semiconductor structures method Grant 9,087,841 - Christiansen , et al. July 21, 2 | 2015-07-21 |
Alternating open-ended via chains for testing via formation and dielectric integrity Grant 9,059,052 - Chen , et al. June 16, 2 | 2015-06-16 |
Self-correcting Power Grid For Semiconductor Structures Method App 20150115400 - Christiansen; Cathryn J. ;   et al. | 2015-04-30 |
Alternating Open-ended Via Chains For Testing Via Formation And Dielectric Integrity App 20140339558 - Chen; Fen ;   et al. | 2014-11-20 |
Thermal sensor for semiconductor circuits Grant 8,562,210 - Abadeer , et al. October 22, 2 | 2013-10-22 |
Method for fabricating air gap interconnect structures Grant 8,383,507 - Chanda , et al. February 26, 2 | 2013-02-26 |
Determining critical current density for interconnect Grant 8,232,809 - Burke , et al. July 31, 2 | 2012-07-31 |
Thermal Sensor For Semiconductor Circuits App 20120128033 - Abadeer; Wagdi W. ;   et al. | 2012-05-24 |
Air Gap Interconnect Structures And Methods For Forming The Same App 20120111825 - Chanda; Kaushik ;   et al. | 2012-05-10 |
Air gap interconnect structures and methods for forming the same Grant 8,120,179 - Chanda , et al. February 21, 2 | 2012-02-21 |
Thermo-mechanical cleavable structure Grant 8,018,017 - Chen , et al. September 13, 2 | 2011-09-13 |
Determining Critical Current Density For Interconnect App 20110115508 - Burke; Chad M. ;   et al. | 2011-05-19 |
Air Gap Interconnect Structures And Methods For Forming The Same App 20110108992 - Chanda; Kaushik ;   et al. | 2011-05-12 |
Thermo-mechanical Cleavable Structure App 20060163685 - Chen; Fen ;   et al. | 2006-07-27 |
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