Chou; Hong-Hsing

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chou; Hong-Hsing.The latest application filed is for "systems and methods for a narrow band high transmittance interference filter".

Company Profile

1.14.15

Chou; Hong-Hsing - Hsinchu County TW
Chou; Hong-Hsing - Jhubei TW
CHOU; Hong-Hsing - Jhubei City TW
Chou; Hong-Hsing - Taipei TW
Chou; Hong-Hsing - Taipei City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems And Methods For A Narrow Band High Transmittance Interference Filter App 20210373442 - Hung; Wolf ; et al.	2021-12-02
Systems and methods for a narrow band high transmittance interference filter Grant 11,092,898 - Hung , et al. August 17, 2	2021-08-17
Apparatus for supporting a semiconductor wafer and method of vibrating a semiconductor wafer Grant 10,871,720 - Sharma , et al. December 22, 2	2020-12-22
Plasma generation for ion implanter Grant 10,163,609 - Lin , et al. Dec	2018-12-25
Plasma Generation For Ion Implanter App 20180174807 - LIN; Tsung-Min ; et al.	2018-06-21
Method for sealing processing module Grant 9,970,105 - Chen , et al. May 15, 2	2018-05-15
Systems And Methods For A Narrow Band High Transmittance Interference Filter App 20180101101 - Hung; Wolf ; et al.	2018-04-12
Systems and methods for a narrow band high transmittance interference filter Grant 9,835,952 - Hung , et al. December 5, 2	2017-12-05
Method for monitoring usage of a physical vapor deposition (PVD) target with an ultrasonic transducer Grant 9,791,415 - Yang , et al. October 17, 2	2017-10-17
Photoresist coating scheme Grant 9,720,325 - Hsu , et al. August 1, 2	2017-08-01
Automated wafer inspection Grant 9,575,012 - Lin , et al. February 21, 2	2017-02-21
Temperature modification for chemical mechanical polishing Grant 9,550,270 - Hung , et al. January 24, 2	2017-01-24
Method For Monitoring Usage Of A Physical Vapor Deposition (pvd) Target With An Ultrasonic Transducer App 20160376695 - Yang; Tsung-Jen ; et al.	2016-12-29
Sapphire pad conditioner Grant 9,452,509 - Hung , et al. September 27, 2	2016-09-27
Apparatus For Supporting A Semiconductor Wafer And Method Of Vibrating A Semiconductor Wafer App 20160096155 - SHARMA; Astha ; et al.	2016-04-07
Ultraviolet light emitting diode array light source for photolithography and method Grant 9,128,387 - Shih , et al. September 8, 2	2015-09-08
Method of applying photoresist to a semiconductor substrate Grant 9,097,972 - Lin , et al. August 4, 2	2015-08-04
Method For Sealing Processing Module App 20150179456 - CHEN; Chun-Ta ; et al.	2015-06-25
Photoresist Coating Scheme App 20150079806 - Hsu; Chih-Hsien ; et al.	2015-03-19
Temperature Modification For Chemical Mechanical Polishing App 20150038056 - Hung; Jung-Lung ; et al.	2015-02-05
Arc chamber with multiple cathodes for an ion source Grant 8,933,630 - Lin , et al. January 13, 2	2015-01-13
Sapphire Pad Conditioner App 20150004787 - Hung; Jung-Lung ; et al.	2015-01-01
Ultraviolet Light Emitting Diode Array Light Source For Photolithography And Method App 20140340665 - SHIH; Jaw-Lih ; et al.	2014-11-20
Automated Wafer Inspection App 20140267692 - Hu-Wei; Lin ; et al.	2014-09-18
Systems and Methods for a Narrow Band High Transmittance Interference Filter App 20140273459 - Hung; Wolf ; et al.	2014-09-18
Method Of Applying Photoresist To A Semiconductor Substrate App 20140210057 - Lin; Yen-Chen ; et al.	2014-07-31
Arc Chamber With Multiple Cathodes For An Ion Source App 20140167614 - LIN; Chin-Tsung ; et al.	2014-06-19
Methods for optimizing die placement Grant 7,353,077 - Lin , et al. April 1, 2	2008-04-01
Methods for optimizing die placement App 20070027567 - Lin; Chih-Wei ; et al.	2007-02-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.