Chon; Sang-Mun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chon; Sang-Mun.The latest application filed is for "thinner composition and method of removing photoresist using the same".

Company Profile

0.34.39

Chon; Sang-Mun - Yongin-si KR
Chon; Sang-Mun - Seongnam-si KR
Chon; Sang-Mun - Gyeonggi-do KR
Chon; Sang-Mun - Yonging-si KR
Chon; Sang-Mun - Kyeongki-do KR
Chon; Sang-mun - Sungnam KR
Chon; Sang-Mun - Seongnam KR
Chon; Sang-Mun - Kyunggi-do KR
Chon; Sang-Mun - Yongin KR
Chon, Sang-Mun - Yongin-city KR
Chon, Sang-Mun - Yongin-shi KR
Chon, Sang-Mun - Sungnam-city KR
Chon, Sang-Mun - Seongnam-City KR
Chon; Sang-mun - Kyungki-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Thinner composition and method of removing photoresist using the same Grant 7,863,231 - Ahn , et al. January 4, 2	2011-01-04
Additive composition, slurry composition including the same, and method of polishing an object using the slurry composition Grant 7,858,527 - Kim , et al. December 28, 2	2010-12-28
Composition for removing photoresist, method of removing photoresist and method of manufacturing a semiconductor device using the same Grant 7,678,751 - Park , et al. March 16, 2	2010-03-16
Methods of forming a thin film and methods of manufacturing a capacitor and a gate structure using the same Grant 7,642,200 - Lee , et al. January 5, 2	2010-01-05
Method of forming metal oxide using an atomic layer deposition process Grant 7,605,094 - Lee , et al. October 20, 2	2009-10-20
Method and apparatus for detecting a photolithography processing error, and method and apparatus for monitoring a photolithography process Grant 7,573,568 - Yang , et al. August 11, 2	2009-08-11
Method and apparatus for inspecting defects in multiple regions with different parameters Grant 7,433,032 - Kim , et al. October 7, 2	2008-10-07
Thinner Composition And Method Of Removing Photoresist Using The Same App 20080214422 - AHN; Seung-Hyun ; et al.	2008-09-04
Thinner composition and method of removing photoresist using the same Grant 7,387,988 - Ahn , et al. June 17, 2	2008-06-17
Method and apparatus for inspecting substrate pattern Grant 7,385,689 - Kim , et al. June 10, 2	2008-06-10
Additive Composition, Slurry Composition Including The Same, And Method Of Polishing An Object Using The Slurry Composition App 20080014838 - KIM; Nam-Soo ; et al.	2008-01-17
Etching composition, method of preparing the same, method of etching an oxide film, and method of manufacturing a semiconductor device Grant 7,311,857 - Ko , et al. December 25, 2	2007-12-25
Method of Forming Metal Oxide Using an Atomic Layer Deposition Process App 20070292628 - Lee; Jung-Ho ; et al.	2007-12-20
Method and apparatus for inspecting a wafer surface Grant 7,310,140 - Eom , et al. December 18, 2	2007-12-18
Additive composition, slurry composition including the same, and method of polishing an object using the slurry composition Grant 7,288,212 - Kim , et al. October 30, 2	2007-10-30
Method and apparatus for inspecting defects Grant 7,271,890 - Kim , et al. September 18, 2	2007-09-18
Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination Grant 7,258,931 - Kim , et al. August 21, 2	2007-08-21
Method of forming metal oxide using an atomic layer deposition process Grant 7,250,379 - Lee , et al. July 31, 2	2007-07-31
Resist and etching by-product removing composition and resist removing method using the same Grant 7,223,721 - Park , et al. May 29, 2	2007-05-29
Composition for removing photoresist and method of forming a bump electrode in a semiconductor device using the composition Grant 7,183,192 - Park , et al. February 27, 2	2007-02-27
Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same Grant 7,179,537 - Lee , et al. February 20, 2	2007-02-20
Wafer carrier for minimizing contacting area with wafers App 20060216942 - Kim; Gi-Jung ; et al.	2006-09-28
Method and apparatus for inspecting a substrate Grant 7,113,274 - Yang , et al. September 26, 2	2006-09-26
Methods of forming a thin film and methods of manufacturing a capacitor and a gate structure using the same App 20060166512 - Lee; Jung-Ho ; et al.	2006-07-27
Method of measuring a level of contamination in a chemical solution and systems thereof App 20060160239 - Lee; Sung-Jae ; et al.	2006-07-20
Composition for removing photoresist, method of removing photoresist and method of manufacturing a semiconductor device using the same App 20060122084 - Park; Jung-Dae ; et al.	2006-06-08
Method of inspecting defects and apparatus for performing the same App 20060082766 - Kim; Joung-Soo ; et al.	2006-04-20
Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same Grant 7,027,638 - Jun , et al. April 11, 2	2006-04-11
Method and apparatus for inspecting substrate pattern App 20060039598 - Kim; Kye-Weon ; et al.	2006-02-23
Grating and clean room system comprising the same App 20060003684 - Hwang; Jung-Sung ; et al.	2006-01-05
Method of forming metal oxide using an atomic layer deposition process App 20050277223 - Lee, Jung-Ho ; et al.	2005-12-15
Methods of monitoring rinsing solutions and related systems and reagents App 20050227363 - Hwang, Dong-won ; et al.	2005-10-13
Apparatus and method for measuring substrates App 20050191768 - Yoon, Young-Jee ; et al.	2005-09-01
Thinner composition and method of removing photoresist using the same App 20050176607 - Ahn, Seung-Hyun ; et al.	2005-08-11
Method and apparatus for measuring contamination of a semiconductor substrate Grant 6,927,077 - Eom , et al. August 9, 2	2005-08-09
Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays App 20050151456 - Yoon, Young-Jee ; et al.	2005-07-14
Method and apparatus for inspecting defects App 20050094137 - Kim, Joung-Soo ; et al.	2005-05-05
Etching composition, method of preparing the same, method of etching an oxide film, and method of manufacturing a semiconductor device App 20050081883 - Ko, Yong-Kyun ; et al.	2005-04-21
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image Grant 6,870,948 - Jun , et al. March 22, 2	2005-03-22
Method and apparatus for detecting contaminants in ion-implanted wafer Grant 6,869,215 - Yang , et al. March 22, 2	2005-03-22
Composition for removing photoresist and method of forming a bump electrode in a semiconductor device using the composition App 20050032658 - Park, Dong-Jin ; et al.	2005-02-10
Method and apparatus for detecting a photolithography processing error, and method and apparatus for monitoring a photolithography process App 20050026054 - Yang, Yu-Sin ; et al.	2005-02-03
Method and apparatus for inspecting a wafer surface App 20040263836 - Eom, Tae-Min ; et al.	2004-12-30
Apparatus for drying semiconductor substrates using azeotrope effect and drying method using the apparatus App 20040226186 - Chon, Sang-Mun ; et al.	2004-11-18
RF matching unit Grant 6,816,029 - Choi , et al. November 9, 2	2004-11-09
Method and apparatus for inspecting a substrate App 20040169851 - Yang, Yu-Sin ; et al.	2004-09-02
Method and apparatus for detecting contaminants in ion-implanted wafer App 20040105486 - Yang, Yu-Sin ; et al.	2004-06-03
Method and apparatus for measuring contamination of a semiconductor substrate App 20040100298 - Eom, Tae-Min ; et al.	2004-05-27
Method and apparatus for analyzing a sample employing fast fourier transformation App 20040086167 - Jun, Chung-Sam ; et al.	2004-05-06
Cleaning solution and method for cleaning ceramic parts using the same App 20040060579 - Kim, Jaung-Joo ; et al.	2004-04-01
Resist and etching by-product removing composition and resist removing method using the same Grant 6,713,440 - Park , et al. March 30, 2	2004-03-30
Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same Grant 6,706,646 - Lee , et al. March 16, 2	2004-03-16
Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination and methods of forming same App 20040041143 - Kim, Gi-Jung ; et al.	2004-03-04
Thinner composition and method of stripping a photoresist using the same Grant 6,682,876 - Ahn , et al. January 27, 2	2004-01-27
Apparatus for drying semiconductor substrates using azeotrope effect and drying method using the apparatus App 20040010932 - Chon, Sang-Mun ; et al.	2004-01-22
System and method for drying semiconductor substrate Grant 6,655,042 - Yi , et al. December 2, 2	2003-12-02
Thinner composition and method of stripping a photoresist using the same App 20030157441 - Ahn, Seung-Hyun ; et al.	2003-08-21
Photoresist Stripper Compositions App 20030113673 - Ahn, Seung-Hyun ; et al.	2003-06-19
System and method for drying semiconductor substrate App 20030106239 - Yi, Hun-jung ; et al.	2003-06-12
Additive composition, slurry composition including the same, and method of polishing an object using the slurry composition App 20030092265 - Kim, Nam-Soo ; et al.	2003-05-15
Resist and etching by-product removing composition and resist removing method using the same App 20030078174 - Park, Dong-Jin ; et al.	2003-04-24
Method of and device for detecting micro-scratches Grant 6,528,333 - Jun , et al. March 4, 2	2003-03-04
Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same App 20030040194 - Lee, Jung-Ho ; et al.	2003-02-27
Method and apparatus for detecting thickness of thin layer formed on a wafer Grant 6,515,293 - Jun , et al. February 4, 2	2003-02-04
Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same App 20020172412 - Jun, Chung-sam ; et al.	2002-11-21
Method of and device for detecting micro-scratches Grant 6,449,037 - Jun , et al. September 10, 2	2002-09-10
Method of measuring etched state of semiconductor wafer using optical impedence measurement Grant 6,440,760 - Cho , et al. August 27, 2	2002-08-27
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image App 20020072133 - Jun, Chung-Sam ; et al.	2002-06-13
RF matching unit App 20020023718 - Choi, Dae-Kyu ; et al.	2002-02-28
Use of alkoxy N-hydroxyalkyl alkanamide as resist removing agent, composition for removing resist, method for preparing the same and resist removing method using the same App 20010049346 - Park, Dong-Jin ; et al.	2001-12-06
Method of and device for detecting micro-scratches App 20010038448 - Jun, Chung-Sam ; et al.	2001-11-08
Chemical refining method and reuse system for semiconductor device manufacturing Grant 6,137,018 - Ko , et al. October 24, 2	2000-10-24
Semiconductor substrate cleaning solutions, methods of forming the same, and methods using the same Grant 5,846,921 - Gil , et al. December 8, 1	1998-12-08

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