Choi; Sang Bong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Choi; Sang Bong.The latest application filed is for "cytochrome p450 gene for increasing seed size or water stress resistance of plant".

Company Profile

0.8.4

Choi; Sang Bong - Seongnam-si KR
Choi; Sang-bong - Suwon KR
Choi; Sang-Bong - Suwon-si KR
Choi, Sang-bong - Suwon-city KR
Choi; Sang-bong - Kyungki-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Cytochrome P450 gene for increasing seed size or water stress resistance of plant Grant 8,153,862 - Kim , et al. April 10, 2	2012-04-10
Cytochrome P450 Gene For Increasing Seed Size Or Water Stress Resistance Of Plant App 20100281576 - Kim; Ho Bang ; et al.	2010-11-04
Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same Grant 7,027,638 - Jun , et al. April 11, 2	2006-04-11
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image Grant 6,870,948 - Jun , et al. March 22, 2	2005-03-22
Method of and device for detecting micro-scratches Grant 6,528,333 - Jun , et al. March 4, 2	2003-03-04
Method and apparatus for detecting thickness of thin layer formed on a wafer Grant 6,515,293 - Jun , et al. February 4, 2	2003-02-04
Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same App 20020172412 - Jun, Chung-sam ; et al.	2002-11-21
Method of and device for detecting micro-scratches Grant 6,449,037 - Jun , et al. September 10, 2	2002-09-10
Method of measuring etched state of semiconductor wafer using optical impedence measurement Grant 6,440,760 - Cho , et al. August 27, 2	2002-08-27
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image App 20020072133 - Jun, Chung-Sam ; et al.	2002-06-13
Apparatus and method for contact failure inspection in semiconductor devices Grant 6,366,688 - Jun , et al. April 2, 2	2002-04-02
Method of and device for detecting micro-scratches App 20010038448 - Jun, Chung-Sam ; et al.	2001-11-08

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