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Patent applications and USPTO patent grants for CHOI; JONG LIP.The latest application filed is for "scanning electron microscope capable of controlling beam spot and measurement method using the same".
Patent | Date |
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Scanning Electron Microscope Capable Of Controlling Beam Spot And Measurement Method Using The Same App 20160268098 - CHOI; JONG LIP ;   et al. | 2016-09-15 |
Apparatus For Generating Extreme Ultraviolet Light Using Plasma App 20150097107 - Lim; Jae Won ;   et al. | 2015-04-09 |
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