| Patent | Date |
|---|
LED lighting lamp with enhanced heat dissipation function
Grant 11,454,384 - Choi September 27, 2 | 2022-09-27 |
Led Lighting Lamp With Enhanced Heat Dissipation Function
App 20210156556 - CHOI; Ho Jeong | 2021-05-27 |
Air passage type wheel deflector and vehicle having the same
Grant 10,414,451 - Kim , et al. Sept | 2019-09-17 |
Air Passage Type Wheel Deflector And Vehicle Having The Same
App 20190002038 - Kim; Cheol-O ; et al. | 2019-01-03 |
Test socket, and test apparatus with test socket to control a temperature of an object to be tested
Grant 8,564,317 - Han , et al. October 22, 2 | 2013-10-22 |
Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same
Grant 8,139,949 - Lee , et al. March 20, 2 | 2012-03-20 |
Multilayer type test board assembly for high-precision inspection
Grant 7,786,721 - Kim , et al. August 31, 2 | 2010-08-31 |
Apparatus for testing electrical characteristics
App 20100176796 - Kim; Dong-dae ; et al. | 2010-07-15 |
Probe card capable of multi-probing
Grant 7,659,735 - Kim , et al. February 9, 2 | 2010-02-09 |
Fuse regions of a semiconductor memory device and methods of fabricating the same
Grant 7,492,032 - Bang , et al. February 17, 2 | 2009-02-17 |
Electrical Signal Transmission Module, Method Of Transmitting Electric Signals And Electrical Inspection Apparatus Having The Same
App 20090028571 - Lee; Sang-Hoon ; et al. | 2009-01-29 |
Test socket
App 20090009204 - Lee; Sang-Sik ; et al. | 2009-01-08 |
Probe card for testing wafer
App 20080164893 - Lee; Hyun-ae ; et al. | 2008-07-10 |
System and method for testing semiconductor integrated circuit in parallel
App 20080164894 - Kim; Min-Gu ; et al. | 2008-07-10 |
Probe card for test of semiconductor chips and method for test of semiconductor chips using the same
App 20080164898 - Bae; Sung-Hoon ; et al. | 2008-07-10 |
Multilayer type test board assembly for high-precision inspection
App 20080164901 - Kim; Min-Gu ; et al. | 2008-07-10 |
Method of testing a semiconductor chip and jig used in the method
Grant 7,323,891 - Kim , et al. January 29, 2 | 2008-01-29 |
Probe card capable of multi-probing
App 20070152688 - Kim; Min-gu ; et al. | 2007-07-05 |
Method Of Testing A Semiconductor Chip And Jig Used In The Method
App 20070023610 - Kim; Dae-Jong ; et al. | 2007-02-01 |
Fuse regions of a semiconductor memory device and methods of fabricating the same
App 20050236688 - Bang, Kwang-Kyu ; et al. | 2005-10-27 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
Grant 6,861,682 - Bang , et al. March 1, 2 | 2005-03-01 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
Grant 6,850,450 - Bang , et al. February 1, 2 | 2005-02-01 |
Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the same
Grant 6,682,959 - Bang , et al. January 27, 2 | 2004-01-27 |
Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the same
App 20030119227 - Bang, Kwang-Kyu ; et al. | 2003-06-26 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
App 20030095451 - Bang, Jeong-Ho ; et al. | 2003-05-22 |
Architecture of laser fuse box of semiconductor integrated circuit and method for fabricating the same
Grant 6,541,290 - Bang , et al. April 1, 2 | 2003-04-01 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
App 20030026147 - Bang, Kwang-Kyu ; et al. | 2003-02-06 |
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