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name:-0.011176824569702
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Choi; Hee Dok Patent Filings

Choi; Hee Dok

Patent Applications and Registrations

Patent applications and USPTO patent grants for Choi; Hee Dok.The latest application filed is for "deposition rate measuring apparatus".

Company Profile
0.6.7
  • Choi; Hee Dok - Incheon KR
  • Choi; Hee Dok - Inchun KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Deposition rate measuring apparatus
Grant 9,562,798 - Choi February 7, 2
2017-02-07
Deposition Rate Measuring Apparatus
App 20160216143 - CHOI; Hee Dok
2016-07-28
Conductive ink composition, method for manufacturing the same, and method for manufacturing conductive thin layer using the same
Grant 8,999,204 - Hong , et al. April 7, 2
2015-04-07
Fiber Optic Apparatus For Oxygen Sensing
App 20130294975 - Song; Yong Won ;   et al.
2013-11-07
Conductive Ink Composition, Method For Manufacturing The Same, And Method For Manufacturing Conductive Thin Layer Using The Same
App 20120251736 - HONG; Jae-Min ;   et al.
2012-10-04
Oxygen sensor using principle of surface plasmon resonance and oxygen transmission rate measurement system including the same
Grant 8,237,930 - Hong , et al. August 7, 2
2012-08-07
Non-contact type apparatus for testing open and short circuits of a plurality of pattern electrodes formed on a panel
Grant 7,746,086 - Eun , et al. June 29, 2
2010-06-29
Oxygen Sensor Using Principle Of Surface Plasmon Resonance And Oxygen Transmission Rate Measurement System Including The Same
App 20100045997 - HONG; Jae Min ;   et al.
2010-02-25
Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
Grant 7,629,796 - Eun , et al. December 8, 2
2009-12-08
Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
App 20080018338 - Eun; Tak ;   et al.
2008-01-24
Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same
App 20080018339 - Eun; Tak ;   et al.
2008-01-24

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