CHO; SUNG-WEE

Patent Applications and Registrations

Patent applications and USPTO patent grants for CHO; SUNG-WEE.The latest application filed is for "scan flip-flop and scan test circuit including the same".

Company Profile

2.5.6

CHO; SUNG-WEE - HWASEONG-SI KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scan Flip-flop And Scan Test Circuit Including The Same App 20190383875 - KIM; HA-YOUNG ; et al.	2019-12-19
Scan flip-flop and scan test circuit including the same Grant 10,429,443 - Kim , et al. October 1, 2	2019-10-01
Methods of generating integrated circuit layout using standard cell library Grant 10,108,772 - Baek , et al. October 23, 2	2018-10-23
Scan Flip-flop And Scan Test Circuit Including The Same App 20170328954 - KIM; HA-YOUNG ; et al.	2017-11-16
Scan flip-flop and scan test circuit including the same Grant 9,753,086 - Kim , et al. September 5, 2	2017-09-05
Methods Of Generating Integrated Circuit Layout Using Standard Cell Library App 20170011160 - BAEK; Sang-hoon ; et al.	2017-01-12
Methods of generating integrated circuit layout using standard cell library Grant 9,460,259 - Baek , et al. October 4, 2	2016-10-04
Scan Flip-flop And Scan Test Circuit Including The Same App 20160097811 - KIM; HA-YOUNG ; et al.	2016-04-07
Methods Of Generating Integrated Circuit Layout Using Standard Cell Library App 20160055285 - BAEK; Sang-hoon ; et al.	2016-02-25

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