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name:-0.006540060043335
name:-0.0068149566650391
name:-0.00048184394836426
Cho; Jae Patent Filings

Cho; Jae

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cho; Jae.The latest application filed is for "semiconductor component having test pads and method and apparatus for testing same".

Company Profile
0.6.4
  • Cho; Jae - Saratoga CA
  • Cho; Jae - Sunnyvale CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and apparatus for self-regulated burn-in of an integrated circuit
Grant 8,212,576 - Cho , et al. July 3, 2
2012-07-03
Semiconductor component having test pads and method and apparatus for testing same
Grant 7,737,439 - Mardi , et al. June 15, 2
2010-06-15
Semiconductor component having test pads and method and apparatus for testing same
App 20070221920 - Mardi; Mohsen Hossein ;   et al.
2007-09-27
Semiconductor component having test pads and method and apparatus for testing same
App 20070218573 - Mardi; Mohsen Hossein ;   et al.
2007-09-20
Semiconductor component having test pads and method and apparatus for testing same
Grant 7,235,412 - Mardi , et al. June 26, 2
2007-06-26
Application-specific testing methods for programmable logic devices
Grant 6,891,395 - Wells , et al. May 10, 2
2005-05-10
Application-specific testing methods for programmable logic devices
Grant 6,817,006 - Wells , et al. November 9, 2
2004-11-09
Application-specific testing methods for programmable logic devices
App 20040216081 - Wells, Robert W. ;   et al.
2004-10-28
Method of using partially defective programmable logic devices
Grant 6,664,808 - Ling , et al. December 16, 2
2003-12-16
Method of using partially defective programmable logic devices
App 20030062923 - Ling, Zhi-Min ;   et al.
2003-04-03

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