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Patent applications and USPTO patent grants for Cho; Hyungsuk.The latest application filed is for "system and method of inspecting substrate and method of fabricating semiconductor device using the same".
Patent | Date |
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System and method of inspecting substrate and method of fabricating semiconductor device using the same Grant 10,393,672 - Ahn , et al. A | 2019-08-27 |
System And Method Of Inspecting Substrate And Method Of Fabricating Semiconductor Device Using The Same App 20190033232 - AHN; JEONGHO ;   et al. | 2019-01-31 |
Rotation Angle Measurement Marks And Methods Of Measuring Rotation Angle And Tracing Coordinates Using The Same App 20170146340 - Yoon; Doyoung ;   et al. | 2017-05-25 |
Refrigerator Grant D766,996 - Lee , et al. September 20, 2 | 2016-09-20 |
Method of measuring thickness of layer App 20030210408 - Jun, Chungsam ;   et al. | 2003-11-13 |
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