| Patent | Date |
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Method and apparatus for evaluating phase stability of electrode mixture slurry
Grant 11,456,450 - Lim , et al. September 27, 2 | 2022-09-27 |
Method for providing contents for mobile terminal on the basis of user touch and hold time
Grant 11,144,178 - Cho October 12, 2 | 2021-10-12 |
Carbon Nanotube Dispersion And Method For Preparing The Same
App 20210246028 - KIM; Dong Hyun ; et al. | 2021-08-12 |
Conductive Material Dispersion Liquid, Electrode And Lithium Secondary Battery Prepared By Using The Same
App 20210234174 - YOO; Houng Sik ; et al. | 2021-07-29 |
Method For Providing Contents For Mobile Terminal On The Basis Of User Touch And Hold Time
App 20210089177 - CHO; Hyung Suk | 2021-03-25 |
Grinder using induced electric field
Grant 10,888,870 - Son , et al. January 12, 2 | 2021-01-12 |
Method And Apparatus For Evaluating Phase Stability Of Electrode Mixture Slurry
App 20200212430 - LIM; Ga-Hyun ; et al. | 2020-07-02 |
Method For Predicting Processability Of Electrode Slurry And Selecting Electrode Binder
App 20200176776 - YANG; Hwi-Soo ; et al. | 2020-06-04 |
Apparatus and method for preparing slurry for secondary battery
Grant 10,651,497 - Son , et al. | 2020-05-12 |
Anode slurry for secondary battery for improving dispersibility and reducing resistance, and anode comprising same
Grant 10,644,316 - Yoo , et al. | 2020-05-05 |
System for manufacturing electrode for secondary battery having scratch tester
Grant 10,535,862 - Son , et al. Ja | 2020-01-14 |
Electrode for lithium secondary battery and lithium secondary battery including the same
Grant 10,516,160 - Kim , et al. Dec | 2019-12-24 |
Positive electrode for lithium secondary battery and method for preparing the same
Grant 10,516,154 - Seol , et al. Dec | 2019-12-24 |
System For Manufacturing Electrode For Secondary Battery Having Scratch Tester
App 20190140253 - SON; Jin-Young ; et al. | 2019-05-09 |
Anode Slurry For Secondary Battery For Improving Dispersibility And Reducing Resistance, And Anode Comprising Same
App 20180358622 - YOO; Jung Woo ; et al. | 2018-12-13 |
Grinder Using Induced Electric Field
App 20180264478 - Son; Jin Young ; et al. | 2018-09-20 |
Apparatus And Method For Preparing Slurry For Secondary Battery
App 20180191019 - Son; Jin Young ; et al. | 2018-07-05 |
Electrode For Lithium Secondary Battery And Lithium Secondary Battery Including The Same
App 20180076451 - Kim; Seul Ki ; et al. | 2018-03-15 |
Positive Electrode For Lithium Secondary Battery And Method For Preparing The Same
App 20180006289 - Seol; Jong-Heon ; et al. | 2018-01-04 |
Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the same
Grant 9,831,137 - Park , et al. November 28, 2 | 2017-11-28 |
Method of automatic defect classification
Grant 9,727,799 - Park , et al. August 8, 2 | 2017-08-08 |
Defect Imaging Apparatus, Defect Detection System Having The Same, And Method Of Detecting Defects Using The Same
App 20170076435 - PARK; Il-Suk ; et al. | 2017-03-16 |
Method of Automatic Defect Classification
App 20160180513 - Park; Il-suk ; et al. | 2016-06-23 |
Method of detecting a defect of a substrate and apparatus for performing the same
Grant 9,194,816 - Rim , et al. November 24, 2 | 2015-11-24 |
Method of Detecting a Defect of a Substrate and Apparatus for Performing the Same
App 20150070690 - Rim; Min-Ho ; et al. | 2015-03-12 |
Apparatus and method to inspect defect of semiconductor device
Grant 8,546,154 - Shin , et al. October 1, 2 | 2013-10-01 |
Apparatus and method for measuring semiconductor device
Grant 8,324,571 - Kim , et al. December 4, 2 | 2012-12-04 |
Apparatus And Method To Inspect Defect Of Semiconductor Device
App 20120080597 - SHIN; Ji-Young ; et al. | 2012-04-05 |
Apparatus and method to inspect defect of semiconductor device
Grant 8,034,640 - Shin , et al. October 11, 2 | 2011-10-11 |
Apparatus And Method For Measuring Semiconductor Device
App 20100219340 - KIM; Young-Seok ; et al. | 2010-09-02 |
Apparatus And Method To Inspect Defect Of Semiconductor Device
App 20100136717 - SHIN; Ji-Young ; et al. | 2010-06-03 |
Method Of Detecting Defect Of A Pattern In A Semiconductor Device
App 20070025609 - RYU; Sung-Gon ; et al. | 2007-02-01 |
Method of and device for detecting micro-scratches
Grant 6,528,333 - Jun , et al. March 4, 2 | 2003-03-04 |
Diene copolymer substituted by alkoxy silane, and organic and inorganic hybrid composition comprising the same
Grant 6,462,141 - Kim , et al. October 8, 2 | 2002-10-08 |
Method of and device for detecting micro-scratches
Grant 6,449,037 - Jun , et al. September 10, 2 | 2002-09-10 |
Method of measuring etched state of semiconductor wafer using optical impedence measurement
Grant 6,440,760 - Cho , et al. August 27, 2 | 2002-08-27 |
Method of and device for detecting micro-scratches
App 20010038448 - Jun, Chung-Sam ; et al. | 2001-11-08 |
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