Cho; Hyeon-Mo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cho; Hyeon-Mo.The latest application filed is for "photoresist underlayer composition and method of manufacturing semiconductor device by using the same".

Company Profile

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Cho; Hyeon-Mo - Uiwang-si N/A KR
Cho; Hyeon-Mo - Seoul KR
Cho; Hyeon Mo - Urbana IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Resist underlayer composition and method of manufacturing semiconductor integrated circuit device using the same Grant 9,291,899 - Cho , et al. March 22, 2	2016-03-22
Photoresist underlayer composition and method of manufacturing semiconductor device by using the same Grant 8,758,981 - Kim , et al. June 24, 2	2014-06-24
Silicon-based hardmask composition and process of producing semiconductor integrated circuit device using the same Grant 8,524,851 - Kim , et al. September 3, 2	2013-09-03
Photoresist Underlayer Composition And Method Of Manufacturing Semiconductor Device By Using The Same App 20120282776 - KIM; Mi-Young ; et al.	2012-11-08
Resist Underlayer Composition And Process Of Producing Integrated Circuit Devices Using The Same App 20120267766 - KIM; Mi-Young ; et al.	2012-10-25
Resist Underlayer Composition And Method Of Manufacturing Semiconductor Integrated Circuit Devices Using The Same App 20120270143 - YUN; Hui-Chan ; et al.	2012-10-25
Silicon-based hardmask composition and process of producing semiconductor integrated circuit device using the same App 20100279509 - Kim; Sang Kyun ; et al.	2010-11-04
Resist underlayer composition and method of manufacturing semiconductor integrated circuit device using the same App 20100167203 - Cho; Hyeon-Mo ; et al.	2010-07-01
Resist Underlayer Composition And Method Of Manufacturing Integrated Circuit Device Using The Same App 20100167212 - Cho; Hyeon-Mo ; et al.	2010-07-01
Heterogeneous Alkyne Metathesis App 20060281938 - Weissman; Haim ; et al.	2006-12-14

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