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Patent applications and USPTO patent grants for Chiu; Fu-Chien.The latest application filed is for "semiconductor structure and testing method thereof".
Patent | Date |
---|---|
Protection circuit for electrostatic discharge Grant 7,291,887 - Chiu , et al. November 6, 2 | 2007-11-06 |
Semiconductor Structure And Testing Method Thereof App 20060091383 - Chuang; Kun-Fu ;   et al. | 2006-05-04 |
Method and structure for wafer-level reliability electromigration and stress migration test by isothermal heater App 20040124865 - Chuang, Kun Fu ;   et al. | 2004-07-01 |
Electrostatic discharge protection apparatus Grant 6,696,708 - Hou , et al. February 24, 2 | 2004-02-24 |
Protection circuit for electrostatic discharge App 20030234425 - Chiu, Fu-Chien ;   et al. | 2003-12-25 |
Electrostatic discharge protection apparatus App 20030164508 - Hou, Chien-Ti ;   et al. | 2003-09-04 |
SCR and current divider structure of electrostatic discharge protective circuit Grant 6,147,369 - Chen , et al. November 14, 2 | 2000-11-14 |
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