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Chism, II; William W. Patent Filings

Chism, II; William W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chism, II; William W..The latest application filed is for "systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturing".

Company Profile
0.9.6
  • Chism, II; William W. - Austin TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Systems And Methods For High Precision Optical Characterization Of Carrier Transport Properties In Semiconductor Manufacturing
App 20220291281 - Chism, II; William W.
2022-09-15
High precision optical characterization of carrier transport properties in semiconductors
Grant 11,402,429 - Chism, II August 2, 2
2022-08-02
High Precision Optical Characterization Of Carrier Transport Properties In Semiconductors
App 20210165040 - Chism, II; William W.
2021-06-03
High precision optical characterization of carrier transport properties in semiconductors
Grant 10,921,369 - Chism, II February 16, 2
2021-02-16
High Precision Optical Characterization of Carrier Transport Properties in Semiconductors
App 20180188319 - Chism, II; William W.
2018-07-05
Method And Apparatus Of Z-scan Photoreflectance Characterization
App 20120327420 - Chism, II; William W.
2012-12-27
Method and apparatus of z-scan photoreflectance characterization
Grant 8,300,227 - Chism, II October 30, 2
2012-10-30
Method and Apparatus of Z-Scan Photoreflectance Characterization
App 20100315646 - CHISM, II; William W.
2010-12-16
Method of direct Coulomb explosion in laser ablation of semiconductor structures
Grant 7,759,607 - Chism, II July 20, 2
2010-07-20
Method of photo-reflectance characterization of strain and active dopant in semiconductor structures
Grant 7,391,507 - Chism, II June 24, 2
2008-06-24
Polarization modulation photoreflectance characterization of semiconductor electronic interfaces
Grant 7,239,392 - Chism, II July 3, 2
2007-07-03
Laser stimulated atom probe characterization of semiconductor and dielectric structures
Grant 7,122,806 - Chism II October 17, 2
2006-10-17
Polarization modulation photoreflectance characterization of semiconductor quantum confined structures
Grant 6,963,402 - Chism, II November 8, 2
2005-11-08

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