Chin; Soo-Bok

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chin; Soo-Bok.The latest application filed is for "methods for monitoring semiconductor fabrication processes using polarized light".

Company Profile

0.4.9

Chin; Soo-Bok - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods for monitoring semiconductor fabrication processes using polarized light Grant 9,551,653 - Son , et al. January 24, 2	2017-01-24
Methods for Monitoring Semiconductor Fabrication Processes Using Polarized Light App 20160204043 - Son; Woong-Kyu ; et al.	2016-07-14
Apparatus and method for monitoring semiconductor fabrication processes using polarized light Grant 9,322,771 - Son , et al. April 26, 2	2016-04-26
Method of analyzing photolithography processes Grant 9,165,354 - Son , et al. October 20, 2	2015-10-20
Methods And Apparatuses For Measuring Values Of Parameters Of Integrated Circuit Devices App 20150219446 - LEEM; Choon-Shik ; et al.	2015-08-06
Method Of Monitoring Semiconductor Fabrication Process Using Xps App 20140342477 - LEEM; Choon-Shik ; et al.	2014-11-20
Method for detecting defect of substrate Grant 8,890,069 - Sun , et al. November 18, 2	2014-11-18
Method For Detecting Defect Of Substrate App 20140306109 - SUN; Jong-Cheon ; et al.	2014-10-16
Apparatuses And Methods For Extracting Defect Depth Information And Methods Of Improving Semiconductor Device Manufacturing Processes Using Defect Depth Information App 20140307052 - Ahn; Jeong-ho ; et al.	2014-10-16
Apparatus and Method for Monitoring Semiconductor Fabrication Processes Using Polarized Light App 20140264052 - SON; Woong-Kyu ; et al.	2014-09-18
Method Of Analyzing Photolithography Processes App 20140037186 - Son; Woong-Kyu ; et al.	2014-02-06
Method Of Forming Image Of Semiconductor Device, And Method Of Detecting A Defect Of The Semiconductor Device By Using The Image Forming Method App 20120082367 - Byun; Jung-hoon ; et al.	2012-04-05

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