Chikamatsu; Shuichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Chikamatsu; Shuichi.The latest application filed is for "inspection apparatus".
Company Profile
0.21.25
- Chikamatsu; Shuichi - Kounosu JP
- Chikamatsu; Shuichi - Hitachinaka JP
- Chikamatsu; Shuichi - Konosu JP
- Chikamatsu; Shuichi - Kounosu-shi JP
Patent Activity
| Patent | Date |
|---|---|
| Defect inspection system Grant 8,804,109 - Aiko , et al. August 12, 2 | 2014-08-12 |
| Inspection Apparatus App 20130194579 - Mohara; Yukihisa ; et al. | 2013-08-01 |
| Defect Inspection System App 20130182100 - AIKO; Kenji ; et al. | 2013-07-18 |
| Inspection Device And Inspection Method App 20130033705 - TANIGUCHI; Koichi ; et al. | 2013-02-07 |
| Inspection apparatus and inspection method Grant 8,345,233 - Suga , et al. January 1, 2 | 2013-01-01 |
| Defect inspection system Grant 8,319,960 - Aiko , et al. November 27, 2 | 2012-11-27 |
| Inspection device and inspection method Grant 8,314,930 - Taniguchi , et al. November 20, 2 | 2012-11-20 |
| Defect inspection method and defect inspection apparatus Grant 8,228,496 - Chikamatsu , et al. July 24, 2 | 2012-07-24 |
| Inspection Apparatus And Inspection Method App 20120140212 - Suga; Tadashi ; et al. | 2012-06-07 |
| Defect inspecting method and apparatus Grant 8,134,701 - Chikamatsu , et al. March 13, 2 | 2012-03-13 |
| Inspection apparatus and inspection method Grant 8,102,522 - Suga , et al. January 24, 2 | 2012-01-24 |
| Defect Inspection Method, And Defect Inspection Device App 20110141463 - Chikamatsu; Shuichi ; et al. | 2011-06-16 |
| Defect inspection apparatus and defect inspection method Grant 7,953,567 - Shimura , et al. May 31, 2 | 2011-05-31 |
| Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2 | 2011-05-10 |
| Inspection Device And Inspection Method App 20110051131 - TANIGUCHI; Koichi ; et al. | 2011-03-03 |
| Defect inspection method and defect inspection apparatus Grant 7,847,927 - Chikamatsu , et al. December 7, 2 | 2010-12-07 |
| Inspection device and inspection method Grant 7,847,928 - Taniguchi , et al. December 7, 2 | 2010-12-07 |
| Defect Inspection System App 20100271473 - AIKO; Kenji ; et al. | 2010-10-28 |
| Defect Inspection Method and Defect Inspection Apparatus App 20100271627 - CHIKAMATSU; Shuichi ; et al. | 2010-10-28 |
| Defect Inspecting Apparatus App 20100214561 - CHIKAMATSU; Shuichi ; et al. | 2010-08-26 |
| Defect inspection system Grant 7,733,474 - Aiko , et al. June 8, 2 | 2010-06-08 |
| Defect inspecting apparatus Grant 7,733,475 - Chikamatsu , et al. June 8, 2 | 2010-06-08 |
| Defect Inspection Apparatus and Defect Inspection Method App 20100106443 - Shimura; Kei ; et al. | 2010-04-29 |
| Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al. | 2010-04-08 |
| Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2 | 2010-04-06 |
| Defect inspection apparatus and defect inspection method Grant 7,672,799 - Shimura , et al. March 2, 2 | 2010-03-02 |
| Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2 | 2009-12-29 |
| Inspection apparatus and inspection method App 20090262339 - Suga; Tadashi ; et al. | 2009-10-22 |
| Defect Inspecting Apparatus App 20090207405 - CHIKAMATSU; Shuichi ; et al. | 2009-08-20 |
| Defect inspecting apparatus Grant 7,535,561 - Chikamatsu , et al. May 19, 2 | 2009-05-19 |
| Defect Inspection Method And Defect Inspection Apparatus App 20090059216 - Shibata; Yukihiro ; et al. | 2009-03-05 |
| Inspecting Device And Inspecting Method App 20080297786 - Fukushima; Hideki ; et al. | 2008-12-04 |
| Inspection Device And Inspection Method App 20080297779 - TANIGUCHI; Koichi ; et al. | 2008-12-04 |
| Defect inspection system App 20080291436 - Aiko; Kenji ; et al. | 2008-11-27 |
| Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2 | 2008-10-28 |
| Defect Inspection Method and Defect Inspection Apparatus App 20080204736 - Chikamatsu; Shuichi ; et al. | 2008-08-28 |
| Defect Inspection Apparatus and Defect Inspection Method App 20080059094 - SHIMURA; Kei ; et al. | 2008-03-06 |
| Defect inspecting apparatus App 20070216896 - Chikamatsu; Shuichi ; et al. | 2007-09-20 |
| Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2 | 2006-08-29 |
| Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2 | 2006-05-02 |
| Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al. | 2006-02-09 |
| Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al. | 2006-02-09 |
| Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2 | 2002-06-25 |
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