Chien; Jinn-Yeh
Patent Applications and Registrations
Patent applications and USPTO patent grants for Chien; Jinn-Yeh.The latest application filed is for "integrated circuit and method of testing".
- Chien; Jinn-Yeh - Chu Bei TW
- CHIEN; Jinn-Yeh - Chu Bei City TW
- Chien; Jinn-Yeh - Hsinchu TW
- Chien; Jinn-Yeh - Tao-Yuan TW
- Chien; Jinn-Yeh - Chung Lei TW
- Chien, Jinn-Yeh - Chung Lei City TW
- Chien, Jinn-Yeh - Jung-Li TW
| Patent | Date |
|---|---|
| Integrated circuit and method of testing Grant 11,374,561 - Chien June 28, 2 | 2022-06-28 |
| Integrated Circuit And Method Of Testing App 20200321953 - CHIEN; Jinn-Yeh | 2020-10-08 |
| Integrated circuit and method of testing Grant 10,707,853 - Chien | 2020-07-07 |
| Integrated Circuit And Method Of Testing App 20170366177 - CHIEN; Jinn-Yeh | 2017-12-21 |
| Device testing and monitoring method thereof Grant 9,804,220 - Horng , et al. October 31, 2 | 2017-10-31 |
| Integrated circuit and method of testing Grant 9,768,762 - Chien September 19, 2 | 2017-09-19 |
| DCO phase noise with PVT-insensitive calibration circuit in ADPLL applications Grant 9,680,486 - Kuo , et al. June 13, 2 | 2017-06-13 |
| DCO Phase Noise With PVT-Insensitive Calibration Circuit in ADPLL Applications App 20170070231 - KUO; Feng Wei ; et al. | 2017-03-09 |
| In situ on the fly on-chip variation measurement Grant 9,448,281 - Chien , et al. September 20, 2 | 2016-09-20 |
| Time-to-digital converter and related method Grant 9,405,275 - Chien August 2, 2 | 2016-08-02 |
| Device Testing And Monitoring Method Thereof App 20160146881 - HORNG; JAW-JUINN ; et al. | 2016-05-26 |
| Integrated Circuit And Method Of Testing App 20160091560 - CHIEN; Jinn-Yeh | 2016-03-31 |
| System and method for a time-to-digital converter Grant 9,250,612 - Chou , et al. February 2, 2 | 2016-02-02 |
| Power supply regulator Grant 9,189,007 - Ko , et al. November 17, 2 | 2015-11-17 |
| System And Method For A Time-to-digital Converter App 20150268633 - Chou; Mao-Hsuan ; et al. | 2015-09-24 |
| Time-to-Digital Converter and Related Method App 20150248114 - Chien; Jinn-Yeh | 2015-09-03 |
| In Situ on the Fly On-Chip Variation Measurement App 20150177327 - Chien; Jinn-Yeh ; et al. | 2015-06-25 |
| Time-to-digital converter and related method Grant 9,063,519 - Chien June 23, 2 | 2015-06-23 |
| Time-to-Digital Converter and Related Method App 20150054667 - Chien; Jinn-Yeh | 2015-02-26 |
| Smart edge detector Grant 8,575,967 - Yang , et al. November 5, 2 | 2013-11-05 |
| Built in self test for transceiver Grant 8,536,888 - Chien , et al. September 17, 2 | 2013-09-17 |
| Built-in bit error rate test circuit Grant 8,453,043 - Chien , et al. May 28, 2 | 2013-05-28 |
| Digital phase interpolation control for clock and data recovery circuit Grant 8,363,773 - Chien January 29, 2 | 2013-01-29 |
| Smart Edge Detector App 20120280718 - YANG; Shu-Chun ; et al. | 2012-11-08 |
| Power Supply Regulator App 20120229198 - Ko; Chen-Ting ; et al. | 2012-09-13 |
| Output Driver App 20120212866 - KO; Chen-Ting ; et al. | 2012-08-23 |
| Smart edge detector Grant 8,248,105 - Yang , et al. August 21, 2 | 2012-08-21 |
| Built In Self Test For Transceiver App 20120169361 - CHIEN; Jinn-Yeh ; et al. | 2012-07-05 |
| Adaptive elastic buffer for communications Grant 8,184,760 - Chien , et al. May 22, 2 | 2012-05-22 |
| Built-in Bit Error Rate Test Circuit App 20120066559 - Chien; Jinn-Yeh ; et al. | 2012-03-15 |
| Fast locking clock and data recovery Grant 8,116,418 - Chien February 14, 2 | 2012-02-14 |
| Smart Edge Detector App 20110199121 - YANG; Shu-Chun ; et al. | 2011-08-18 |
| Digital Phase Interpolation Control For Clock And Data Recovery Circuit App 20100098203 - Chien; Jinn-Yeh | 2010-04-22 |
| Adaptive Elastic Buffer For Communications App 20100054385 - Chien; Jinn-Yeh ; et al. | 2010-03-04 |
| Fast Locking Clock And Data Recovery App 20090279655 - Chien; Jinn-Yeh | 2009-11-12 |
| Memory built-in self test circuit with full error mapping capability Grant 7,213,186 - Chien May 1, 2 | 2007-05-01 |
| On-chip test apparatus Grant 7,181,662 - Chien February 20, 2 | 2007-02-20 |
| On-chip test apparatus App 20050193296 - Chien, Jinn-Yeh | 2005-09-01 |
| Memory built-in self test circuit with full error mapping capability App 20050166111 - Chien, Jinn-Yeh | 2005-07-28 |
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