Chida; Naomichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chida; Naomichi.The latest application filed is for "displacement sensor".

Company Profile

3.9.9

Chida; Naomichi - Tokyo JP
Chida; Naomichi - Musashino JP
Chida; Naomichi - Musashino-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Displacement sensor Grant 10,634,489 - Chida , et al.	2020-04-28
Measuring device Grant 10,481,082 - Setsuda , et al. Nov	2019-11-19
Signal detection device and optical characteristics measurement device Grant 10,345,231 - Setsuda , et al. July 9, 2	2019-07-09
Displacement Sensor App 20190078875 - CHIDA; Naomichi ; et al.	2019-03-14
Measuring Device App 20190011353 - Setsuda; Kazuki ; et al.	2019-01-10
Signal Detection Device And Optical Characteristics Measurement Device App 20180149587 - SETSUDA; Kazuki ; et al.	2018-05-31
Displacement sensor, spectral characteristic measuring apparatus, color measuring apparatus, planar measured object quality monitoring apparatus, displacement measuring method, spectral characteristic measuring method, and color measuring method Grant 9,605,949 - Tsujii , et al. March 28, 2	2017-03-28
Displacement Sensor, Spectral Characteristic Measuring Apparatus, Color Measuring Apparatus, Planar Measured Object Quality Monitoring Apparatus, Displacement Measuring Method, Spectral Characteristic Measuring Method, And Color Measuring Method App 20170023355 - TSUJII; Atsushi ; et al.	2017-01-26
Displacement sensor, spectral characteristic measuring apparatus, color measuring apparatus, planar measured object quality monitoring apparatus, displacement measuring method, spectral characteristic measuring method, and color measuring method Grant 9,488,468 - Tsujii , et al. November 8, 2	2016-11-08
Material property measuring apparatus Grant 9,170,194 - Ichizawa , et al. October 27, 2	2015-10-27
Material Property Measuring Apparatus App 20150090885 - Ichizawa; Yasushi ; et al.	2015-04-02
Apparatus for measuring position and shape of pattern formed on sheet Grant 8,823,819 - Ichizawa , et al. September 2, 2	2014-09-02
Displacement Sensor, Spectral Characteristic Measuring Apparatus, Color Measuring Apparatus, Planar Measured Object Quality Monitoring Apparatus, Displacement Measuring Method, Spectral Characteristic Measuring Method, And Color Measuring Method App 20140104623 - TSUJII; Atsushi ; et al.	2014-04-17
Apparatus For Measuring Position And Shape Of Pattern Formed On Sheet App 20120081539 - Ichizawa; Yasushi ; et al.	2012-04-05
Position Measuring System App 20110273557 - Ichizawa; Yasushi ; et al.	2011-11-10
Focus error detecting optical system for a microscope Grant 7,692,856 - Mikuriya , et al. April 6, 2	2010-04-06
Microscope App 20070236687 - Mikuriya; Kenta ; et al.	2007-10-11

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