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name:-0.0075910091400146
name:-0.0056581497192383
name:-0.00052690505981445
Chi; Dae-Gab Patent Filings

Chi; Dae-Gab

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chi; Dae-Gab.The latest application filed is for "method of correcting a position of a prober".

Company Profile
0.6.5
  • Chi; Dae-Gab - Yongin-si N/A KR
  • Chi; Dae-Gab - Gyeonggi-do KR
  • Chi; Dae-gab - Kyunggi-do KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of correcting a position of a prober
Grant 8,400,174 - Oh , et al. March 19, 2
2013-03-19
Method of correcting a position of a prober
App 20100194418 - Oh; Seung-Yong ;   et al.
2010-08-05
Test system of semiconductor device having a handler remote control and method of operating the same
Grant 7,408,339 - Chung , et al. August 5, 2
2008-08-05
Test System Of Semiconductor Device Having A Handler Remote Control And Method Of Operating The Same
App 20070290707 - CHUNG; Ae-Yong ;   et al.
2007-12-20
Test system of semiconductor device having a handler remote control and method of operating the same
Grant 7,230,417 - Chung , et al. June 12, 2
2007-06-12
Test system of semiconductor device having a handler remote control and method of operating the same
App 20060158211 - Chung; Ae-Yong ;   et al.
2006-07-20
Method for electrical testing of semiconductor package that detects socket defects in real time
Grant 6,960,908 - Chung , et al. November 1, 2
2005-11-01
Method for testing a remnant batch of semiconductor devices
Grant 6,922,050 - Chung , et al. July 26, 2
2005-07-26
Method for testing a remnant batch of semiconductor devices
App 20040253753 - Chung, Ae-yong ;   et al.
2004-12-16
Method for electrical testing of semiconductor package that detects socket defects in real time
App 20040207387 - Chung, Ae-yong ;   et al.
2004-10-21

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