Patent | Date |
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Apparatus and method for authentication of electronic device test stations Grant 10,996,308 - Cheng , et al. May 4, 2 | 2021-05-04 |
Test Handler Having Multiple Testing Sectors App 20200341056 - CHENG; Chi Wah ;   et al. | 2020-10-29 |
Apparatus and method for inspecting substantially transparent electronic devices Grant 10,699,932 - Cheung , et al. | 2020-06-30 |
Method and apparatus for aligning electronic components Grant 10,473,714 - Cheng , et al. Nov | 2019-11-12 |
Apparatus And Method For Authentication Of Electronic Device Test Stations App 20190317174 - CHENG; Chi Wah ;   et al. | 2019-10-17 |
Apparatus And Method For Inspecting Substantially Transparent Electronic Devices App 20190311931 - CHEUNG; Yu Sze ;   et al. | 2019-10-10 |
Method and apparatus for aligning probe pins with respect to positions of electronic devices Grant 10,324,126 - Cheung , et al. | 2019-06-18 |
Electrical contact having electrical isolated members for contacting an electrical component Grant 10,151,774 - Cheung , et al. Dec | 2018-12-11 |
Apparatus and method for adjustment of a handling device for handling electronic components Grant 10,115,620 - Cheung , et al. October 30, 2 | 2018-10-30 |
Apparatus for securing electronic devices on a carrier during transportation Grant 10,091,919 - Lam , et al. October 2, 2 | 2018-10-02 |
Method And Apparatus For Aligning Electronic Components App 20180252766 - CHENG; Chi Wah ;   et al. | 2018-09-06 |
Apparatus For Securing Electronic Devices On A Carrier During Transportation App 20180242481 - LAM; Yan Yiu ;   et al. | 2018-08-23 |
Electronic device separator for a feeding apparatus Grant 9,850,074 - Yip , et al. December 26, 2 | 2017-12-26 |
Method And Apparatus For Aligning Probe Pins With Respect To Positions Of Electronic Devices App 20170356958 - CHEUNG; Yu Sze ;   et al. | 2017-12-14 |
Electronic Device Separator For A Feeding Apparatus App 20170283178 - YIP; Shing Kai ;   et al. | 2017-10-05 |
High throughput test handler system Grant 9,606,171 - Cheung , et al. March 28, 2 | 2017-03-28 |
Apparatus And Method For Adjustment Of A Handling Device For Handling Electronic Components App 20170062256 - CHEUNG; Yu Sze ;   et al. | 2017-03-02 |
Apparatus and method for transferring electronic devices Grant 9,561,914 - Yip , et al. February 7, 2 | 2017-02-07 |
Electrical Contact For Contacting An Electrical Component App 20160363610 - CHEUNG; Yu Sze ;   et al. | 2016-12-15 |
Method for aligning electronic components Grant 9,510,460 - Cheung , et al. November 29, 2 | 2016-11-29 |
High Throughput Test Handler System App 20160216322 - CHEUNG; Yu Sze ;   et al. | 2016-07-28 |
Method And Apparatus For Aligning Electronic Components App 20160081198 - CHEUNG; Yu Sze ;   et al. | 2016-03-17 |
Test contactor for electrical testing of electronic components Grant 9,261,536 - Siu , et al. February 16, 2 | 2016-02-16 |
Apparatus And Method Of Using An Imaging Device For Adjustment Of At Least One Handling Device For Handling Semiconductor Components App 20150370244 - SIU; Hing Suen ;   et al. | 2015-12-24 |
Test Contactor For Electrical Testing Of Electronic Components App 20140049279 - SIU; Hing Suen ;   et al. | 2014-02-20 |
Apparatus and method for pick and place handling Grant 6,655,045 - Cheung , et al. December 2, 2 | 2003-12-02 |
Apparatus and method for pick and place handling App 20020133971 - Cheung, Yiu Ming ;   et al. | 2002-09-26 |