CHERN; YIN-PING
Patent Applications and Registrations
Patent applications and USPTO patent grants for CHERN; YIN-PING.The latest application filed is for "wafer testing machine and method for training artificial intelligence model to test wafer".
- CHERN; YIN-PING - Hsinchu TW
- Chern; Yin-Ping - Chiayi County TW
| Patent | Date |
|---|---|
| Wafer testing machine and method for training artificial intelligence model to test wafer App 20210287086 - CHERN; YIN-PING ; et al. | 2021-09-16 |
| Circuit having multiple scan modes for testing Grant 11,073,558 - Wu , et al. July 27, 2 | 2021-07-27 |
| Test Pattern Generating Method, Test Pattern Generating Device And Fault Model Generating Method App 20210132147 - Chen; Ying-Yen ; et al. | 2021-05-06 |
| Circuit Applied To Multiple Scan Modes For Testing App 20200182933 - Wu; Tzung-Jin ; et al. | 2020-06-11 |
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