Cheong; Lin Lee

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cheong; Lin Lee.The latest application filed is for "identification of hot spots or defects by machine learning".

Company Profile

5.7.12

Cheong; Lin Lee - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Identification of hot spots or defects by machine learning Grant 11,443,083 - Su , et al. September 13, 2	2022-09-13
Identification Of Hot Spots Or Defects By Machine Learning App 20220277116 - SU; Jing ; et al.	2022-09-01
Defect prediction Grant 11,403,453 - Cheong , et al. August 2, 2	2022-08-02
Maintenance scheduling for semiconductor manufacturing equipment Grant 11,295,993 - Honda , et al. April 5, 2	2022-04-05
Wafer Bin Map Based Root Cause Analysis App 20210342993 - Honda; Tomonori ; et al.	2021-11-04
Rational Decision-Making Tool for Semiconductor Processes App 20210294950 - Honda; Tomonori ; et al.	2021-09-23
Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value Grant 11,126,092 - Cheong , et al. September 21, 2	2021-09-21
Failure detection and classsification using sensor data and/or measurement data Grant 11,029,359 - Honda , et al. June 8, 2	2021-06-08
Semiconductor yield prediction Grant 11,022,642 - David , et al. June 1, 2	2021-06-01
Defect Prediction App 20210150115 - CHEONG; Lin Lee ; et al.	2021-05-20
Collaborative Learning Model for Semiconductor Applications App 20210142122 - Honda; Tomonori ; et al.	2021-05-13
Anomalous Equipment Trace Detection and Classification App 20210103489 - Burch; Richard ; et al.	2021-04-08
Maintenance Scheduling For Semiconductor Manufacturing Equipment App 20200388545 - Honda; Tomonori ; et al.	2020-12-10
Selective inclusion/exclusion of semiconductor chips in accelerated failure tests Grant 10,777,470 - Cheong , et al. Sept	2020-09-15
Selective Inclusion/exclusion Of Semiconductor Chips In Accelerated Failure Tests App 20190304849 - Cheong; Lin Lee ; et al.	2019-10-03
Failure Detection And Classsification Using Sensor Data And/or Measurement Data App 20190277913 - Honda; Tomonori D. ; et al.	2019-09-12
Identification Of Hot Spots Or Defects By Machine Learning App 20190147127 - SU; Jing ; et al.	2019-05-16
Semiconductor Yield Prediction App 20190064253 - David; Jeffrey Drue ; et al.	2019-02-28
Methods For Identifying A Process Window Boundary App 20180329311 - CHEONG; Lin Lee ; et al.	2018-11-15

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