Cheong; Kwang-Yung
Patent Applications and Registrations
Patent applications and USPTO patent grants for Cheong; Kwang-Yung.The latest application filed is for "testing method detecting localized failure on a semiconductor wafer".
- Cheong; Kwang-Yung - Chungcheongnam-do KR
- Cheong; Kwang-Yung - Chunan-city KR
- Cheong; Kwang-Yung - Chunan KR
| Patent | Date |
|---|---|
| Testing method detecting localized failure on a semiconductor wafer Grant 7,514,949 - Kang , et al. April 7, 2 | 2009-04-07 |
| Testing method detecting localized failure on a semiconductor wafer App 20070035322 - Kang; Joong-Wuk ; et al. | 2007-02-15 |
| Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment App 20060246611 - Cheong; Kwang-Yung ; et al. | 2006-11-02 |
| Method of controlling probe tip sanding in semiconductor device testing equipment Grant 7,094,615 - Cheong , et al. August 22, 2 | 2006-08-22 |
| Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment App 20040051519 - Cheong, Kwang-Yung ; et al. | 2004-03-18 |
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