Cheng; Yuanda R.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Cheng; Yuanda R..The latest application filed is for "enhanced oxygen non-stoichiometry compensation for thin films".
- Cheng; Yuanda R. - Phoenix AZ
- Cheng; Yuanda R. - Singapore SG
| Patent | Date |
|---|---|
| Enhanced Oxygen Non-stoichiometry Compensation For Thin Films App 20090134015 - RACINE; Michael Gene ; et al. | 2009-05-28 |
| Enhanced magnetron sputtering target App 20070007130 - Cheng; Yuanda R. ; et al. | 2007-01-11 |
| Enhanced oxygen non-stoichiometry compensation for thin films App 20060289294 - Racine; Michael Gene ; et al. | 2006-12-28 |
| Enhanced multi-component oxide-containing sputter target alloy compositions App 20060234091 - Racine; Michael Gene ; et al. | 2006-10-19 |
| Sputter target material for improved magnetic layer App 20060042938 - Cheng; Yuanda R. ; et al. | 2006-03-02 |
| Enhanced sputter target alloy compositions App 20050277002 - Ziani, Abdelouahab ; et al. | 2005-12-15 |
| Enhanced sputter target alloy compositions App 20050274221 - Ziani, Abdelouahab ; et al. | 2005-12-15 |
| Grain structure for magnetic recording media App 20050249981 - Cheng, Yuanda R. ; et al. | 2005-11-10 |
| Controlled cooling of sputter targets App 20050236270 - Cheng, Yuanda R. ; et al. | 2005-10-27 |
| Sputter target having modified surface texture App 20050072668 - Kennedy, Steven Roger ; et al. | 2005-04-07 |
| Magnetic thin film media with chromium capping layer Grant 6,641,932 - Xu , et al. November 4, 2 | 2003-11-04 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 