Cheng; Wu-Tung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cheng; Wu-Tung.The latest application filed is for "library cell modeling for transistor-level test pattern generation".

Company Profile

15.94.81

Cheng; Wu-Tung - Lake Oswego OR
Cheng; Wu-Tung - Wilsonville OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Bidirectional scan cells for single-path reversible scan chains Grant 11,408,938 - Cheng , et al. August 9, 2	2022-08-09
Multi-stage machine learning-based chain diagnosis Grant 11,361,248 - Huang , et al. June 14, 2	2022-06-14
Programmable test compactor for improving defect determination Grant 11,320,487 - Cheng , et al. May 3, 2	2022-05-03
Library Cell Modeling For Transistor-level Test Pattern Generation App 20220065929 - Lin; Xijiang ; et al.	2022-03-03
Bidirectional Scan Cells For Single-path Reversible Scan Chains App 20220043062 - Cheng; Wu-Tung ; et al.	2022-02-10
Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolution Grant 11,156,661 - Cheng , et al. October 26, 2	2021-10-26
Diagnostic resolution enhancement with reversible scan chains Grant 11,106,848 - Cheng , et al. August 31, 2	2021-08-31
Chain testing and diagnosis using two-dimensional scan architecture Grant 11,092,645 - Cheng , et al. August 17, 2	2021-08-17
Low pin count reversible scan architecture Grant 11,073,556 - Cheng , et al. July 27, 2	2021-07-27
Optimized scan chain diagnostic pattern generation for reversible scan architecture Grant 11,041,906 - Huang , et al. June 22, 2	2021-06-22
Diagnostic Resolution Enhancement With Reversible Scan Chains App 20210150111 - Cheng; Wu-Tung ; et al.	2021-05-20
Prediction of test pattern counts for scan configuration determination Grant 11,010,523 - Huang , et al. May 18, 2	2021-05-18
Deterministic test pattern generation for designs with timing exceptions Grant 10,977,400 - Cheng , et al. April 13, 2	2021-04-13
Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chain Diagnostic Resolution App 20210033669 - Cheng; Wu-Tung ; et al.	2021-02-04
Deterministic Test Pattern Generation For Designs With Timing Exceptions App 20200410065 - Cheng; Wu-Tung ; et al.	2020-12-31
Low Pin Count Reversible Scan Architecture App 20200341057 - Cheng; Wu-Tung ; et al.	2020-10-29
Optimized Scan Chain Diagnostic Pattern Generation for Reversible Scan Architecture App 20200333398 - Huang; Yu ; et al.	2020-10-22
Cell-aware diagnostic pattern generation for logic diagnosis Grant 10,795,751 - Tang , et al. October 6, 2	2020-10-06
Machine Learning-based Adjustments In Volume Diagnosis Procedures For Determination Of Root Cause Distributions App 20200302321 - Veda; Gaurav ; et al.	2020-09-24
Chain Testing And Diagnosis Using Two-Dimensional Scan Architecture App 20200166571 - Cheng; Wu-Tung ; et al.	2020-05-28
Cell-aware root cause deconvolution for defect diagnosis and yield analysis Grant 10,592,625 - Tang , et al.	2020-03-17
Generating root cause candidates for yield analysis Grant 10,496,779 - Benware , et al. De	2019-12-03
Deep Learning Based Test Compression Analyzer App 20190311290 - Huang; Yu ; et al.	2019-10-10
Scan cell selection for partial scan designs Grant 10,372,855 - Lin , et al.	2019-08-06
Multi-Stage Machine Learning-Based Chain Diagnosis App 20190220776 - Huang; Yu ; et al.	2019-07-18
Input Data Compression For Machine Learning-Based Chain Diagnosis App 20190220745 - Huang; Yu ; et al.	2019-07-18
Wide-range clock signal generation for speed grading of logic cores Grant 10,317,462 - Huang , et al.	2019-06-11
Circuit defect diagnosis based on sink cell fault models Grant 10,234,502 - Tang , et al.	2019-03-19
Transition test generation for detecting cell internal defects Grant 10,222,420 - Lin , et al.	2019-03-05
Multi-stage test response compactors Grant 10,120,024 - Rajski , et al. November 6, 2	2018-11-06
Cell-Aware Diagnostic Pattern Generation For Logic Diagnosis App 20180253346 - Tang; Huaxing ; et al.	2018-09-06
Counter-Based Scan Chain Diagnosis App 20180217204 - Huang; Yu ; et al.	2018-08-02
Multi-stage Test Response Compactors App 20180156867 - Rajski; Janusz ; et al.	2018-06-07
Generating test sets for diagnosing scan chain failures Grant 9,977,080 - Guo , et al. May 22, 2	2018-05-22
Channel sharing for testing circuits having non-identical cores Grant 9,915,702 - Huang , et al. March 13, 2	2018-03-13
Dynamic design partitioning for diagnosis Grant 9,857,421 - Tang , et al. January 2, 2	2018-01-02
Wide-Range Clock Signal Generation For Speed Grading Of Logic Cores App 20170328952 - Huang; Shi-Yu ; et al.	2017-11-16
Multi-stage test response compactors Grant 9,778,316 - Rajski , et al. October 3, 2	2017-10-03
Method and circuit of pulse-vanishing test Grant 9,720,038 - Huang , et al. August 1, 2	2017-08-01
Transition Test Generation For Detecting Cell Internal Defects App 20170193155 - Lin; Xijiang ; et al.	2017-07-06
Test access architecture for stacked memory and logic dies Grant 9,689,918 - Cheng , et al. June 27, 2	2017-06-27
Expanded canonical forms of layout patterns Grant 9,626,474 - Cheng April 18, 2	2017-04-18
Generating Root Cause Candidates For Yield Analysis App 20170103158 - Benware; Robert Brady ; et al.	2017-04-13
Identification of power sensitive scan cells Grant 9,501,589 - Lin , et al. November 22, 2	2016-11-22
Multi-stage Test Response Compactors App 20160320450 - Rajski; Janusz ; et al.	2016-11-03
Generating root cause candidates for yield analysis Grant 9,443,051 - Benware , et al. September 13, 2	2016-09-13
Dynamic Design Partitioning For Diagnosis App 20160245866 - Tang; Huaxing ; et al.	2016-08-25
Canonical forms of layout patterns Grant 9,378,327 - Cheng , et al. June 28, 2	2016-06-28
Test architecture for characterizing interconnects in stacked designs Grant 9,335,376 - Cheng , et al. May 10, 2	2016-05-10
Dynamic design partitioning for diagnosis Grant 9,336,107 - Tang , et al. May 10, 2	2016-05-10
Dynamic design partitioning for scan chain diagnosis Grant 9,244,125 - Huang , et al. January 26, 2	2016-01-26
Two-dimensional scan architecture Grant 9,222,978 - Huang , et al. December 29, 2	2015-12-29
Expanded Canonical Forms Of Layout Patterns App 20150302137 - Cheng; Wu-Tung	2015-10-22
Hybrid memory failure bitmap classification Grant 9,135,103 - Huang , et al. September 15, 2	2015-09-15
Scan Cell Selection For Partial Scan Designs App 20150248515 - Lin; Xijiang ; et al.	2015-09-03
Cell Internal Defect Diagnosis App 20150234978 - Tang; Huaxing ; et al.	2015-08-20
Fault dictionary based scan chain failure diagnosis Grant 9,110,138 - Guo , et al. August 18, 2	2015-08-18
Generating Test Sets For Diagnosing Scan Chain Failures App 20150226796 - Guo; Ruifeng ; et al.	2015-08-13
Detection and diagnosis of scan cell internal defects Grant 9,086,459 - Guo , et al. July 21, 2	2015-07-21
Faulty chains identification without masking chain patterns Grant 9,057,762 - Huang , et al. June 16, 2	2015-06-16
Channel Sharing For Testing Circuits Having Non-Identical Cores App 20150149847 - Huang; Yu ; et al.	2015-05-28
Canonical Forms Of Layout Patterns App 20150135151 - Cheng; Wu-Tung ; et al.	2015-05-14
Speeding Up Defect Diagnosis Techniques App 20150135030 - Zou; Wei ; et al.	2015-05-14
Test access mechanism for diagnosis based on partitioning scan chains Grant 9,026,874 - Cheng , et al. May 5, 2	2015-05-05
Diagnosis-aware scan chain stitching Grant 9,015,543 - Huang , et al. April 21, 2	2015-04-21
Identification Of Power Sensitive Scan Cells App 20150040087 - Lin; Xijiang ; et al.	2015-02-05
Generating test sets for diagnosing scan chain failures Grant 8,935,582 - Guo , et al. January 13, 2	2015-01-13
Method and Circuit Of Pulse-Vanishing Test App 20140347088 - Huang; Shi-Yu ; et al.	2014-11-27
Compound hold-time fault diagnosis Grant 8,862,956 - Huang , et al. October 14, 2	2014-10-14
Profiling-based scan chain diagnosis Grant 8,843,796 - Cheng , et al. September 23, 2	2014-09-23
Programmable Leakage Test For Interconnects In Stacked Designs App 20140246705 - Huang; Shi-Yu ; et al.	2014-09-04
Speeding up defect diagnosis techniques Grant 8,812,922 - Zou , et al. August 19, 2	2014-08-19
Dynamic Design Partitioning For Scan Chain Diagnosis App 20140164859 - Huang; Yu ; et al.	2014-06-12
Fault Dictionary Based Scan Chain Failure Diagnosis App 20140115413 - Guo; Ruifeng ; et al.	2014-04-24
Test Access Mechanism For Diagnosis Based On Partitioning Scan Chains App 20140101506 - Cheng; Wu-Tung ; et al.	2014-04-10
Method and system for scan chain diagnosis Grant 8,689,070 - Huang , et al. April 1, 2	2014-04-01
Generating Root Cause Candidates For Yield Analysis App 20140059511 - Benware; Robert Brady ; et al.	2014-02-27
Test pattern generation for diagnosing scan chain failures Grant 8,661,304 - Guo , et al. February 25, 2	2014-02-25
Fault dictionary-based scan chain failure diagnosis Grant 8,615,695 - Guo , et al. December 24, 2	2013-12-24
Test access mechanism for diagnosis based on partitioining scan chains Grant 8,607,107 - Cheng , et al. December 10, 2	2013-12-10
Enhanced diagnosis with limited failure cycles Grant 8,595,574 - Huang , et al. November 26, 2	2013-11-26
Enhanced Diagnosis With Limited Failure Cycles App 20130246869 - Huang; Yu ; et al.	2013-09-19
Diagnostic test pattern generation for small delay defect Grant 8,527,232 - Guo , et al. September 3, 2	2013-09-03
Hybrid Memory Failure Bitmap Classification App 20130219216 - Huang; Yu ; et al.	2013-08-22
Diagnosis-Aware Scan Chain Stitching App 20130166976 - Huang; Yu ; et al.	2013-06-27
Speed-path debug using at-speed scan test patterns Grant 8,468,409 - Guo , et al. June 18, 2	2013-06-18
Performance of signature-based diagnosis for logic BIST Grant 8,448,032 - Sharma , et al. May 21, 2	2013-05-21
Enhanced diagnosis with limited failure cycles Grant 8,438,438 - Huang , et al. May 7, 2	2013-05-07
Test Pattern Generation For Diagnosing Scan Chain Failures App 20130080849 - Guo; Ruifeng ; et al.	2013-03-28
Test pattern generation for diagnosing scan chain failures Grant 8,316,265 - Guo , et al. November 20, 2	2012-11-20
Compactor independent fault diagnosis Grant 8,301,414 - Cheng , et al. October 30, 2	2012-10-30
Direct fault diagnostics using per-pattern compactor signatures Grant 8,280,687 - Cheng , et al. October 2, 2	2012-10-02
Compactor independent direct diagnosis of test hardware Grant 8,280,688 - Huang , et al. October 2, 2	2012-10-02
Two-Dimensional Scan Architecture App 20120233512 - Huang; Yu ; et al.	2012-09-13
Generating test sets for diagnosing scan chain failures Grant 8,261,142 - Guo , et al. September 4, 2	2012-09-04
Generating Test Sets For Diagnosing Scan Chain Failures App 20120216088 - Guo; Ruifeng ; et al.	2012-08-23
Compound Hold-Time Fault Diagnosis App 20120210184 - Huang; Yu ; et al.	2012-08-16
Testing embedded memories in an integrated circuit Grant 8,209,572 - Ross , et al. June 26, 2	2012-06-26
Accurately identifying failing scan bits in compression environments Grant 8,086,923 - Cheng , et al. December 27, 2	2011-12-27
Profiling-Based Scan Chain Diagnosis App 20110307751 - Cheng; Wu-Tung ; et al.	2011-12-15
Test Access Mechanism For Diagnosis Based On Partitioining Scan Chains App 20110258504 - Cheng; Wu-Tung ; et al.	2011-10-20
Detection And Diagnosis Of Scan Cell Internal Defects App 20110191643 - Guo; Ruifeng ; et al.	2011-08-04
The Performance Of Signature-Based Diagnosis For Logic BIST App 20110179326 - Sharma; Manish ; et al.	2011-07-21
Testing Embedded Memories In An Integrated Circuit App 20110145774 - Ross; Don E. ; et al.	2011-06-16
Enhanced Diagnosis With Limited Failure Cycles App 20110126064 - Huang; Yu ; et al.	2011-05-26
Compactor Independent Direct Diagnosis Of Test Hardware App 20100306606 - Huang; Yu ; et al.	2010-12-02
Built-in self-test of integrated circuits using selectable weighting of test patterns Grant 7,840,865 - Lai , et al. November 23, 2	2010-11-23
Enhanced diagnosis with limited failure cycles Grant 7,840,862 - Huang , et al. November 23, 2	2010-11-23
Method And System For Scan Chain Diagnosis App 20100293422 - Huang; Yu ; et al.	2010-11-18
Defect localization based on defective cell diagnosis Grant 7,836,366 - Sharma , et al. November 16, 2	2010-11-16
Testing embedded memories in an integrated circuit Grant 7,831,871 - Ross , et al. November 9, 2	2010-11-09
Diagnostic Test Pattern Generation For Small Delay Defect App 20100274518 - Guo; Ruifeng ; et al.	2010-10-28
Multi-stage test response compactors Grant 7,818,644 - Rajski , et al. October 19, 2	2010-10-19
Diagnosing mixed scan chain and system logic defects Grant 7,788,561 - Huang , et al. August 31, 2	2010-08-31
Speed-Path Debug Using At-Speed Scan Test Patterns App 20100185908 - Guo; Ruifeng ; et al.	2010-07-22
Compactor independent direct diagnosis of test hardware Grant 7,729,884 - Huang , et al. June 1, 2	2010-06-01
Full-speed BIST controller for testing embedded synchronous memories Grant 7,721,174 - Cheng , et al. May 18, 2	2010-05-18
Removing the effects of unknown test values from compacted test responses Grant 7,716,548 - Cheng , et al. May 11, 2	2010-05-11
Increased Fault Diagnosis Throughput Using Dictionaries For Hyperactive Faults App 20090287438 - Cheng; Wu-Tung ; et al.	2009-11-19
Accurately Identifying Failing Scan Bits In Compression Environments App 20090254786 - Cheng; Wu-Tung ; et al.	2009-10-08
Test Pattern Generation For Diagnosing Scan Chain Failures App 20090235134 - Guo; Ruifeng ; et al.	2009-09-17
Testing Embedded Memories In An Integrated Circuit App 20090172486 - Ross; Don E. ; et al.	2009-07-02
Testing embedded memories in an integrated circuit Grant 7,502,976 - Ross , et al. March 10, 2	2009-03-10
Reduced-pin-count-testing architectures for applying test patterns Grant 7,487,419 - Mukherjee , et al. February 3, 2	2009-02-03
Removing the effects of unknown test values from compacted test responses App 20080294953 - Cheng; Wu-Tung ; et al.	2008-11-27
Fault dictionary-based scan chain failure diagnosis App 20080250284 - Guo; Ruifeng ; et al.	2008-10-09
Flexible memory built-in-self-test (MBIST) method and apparatus Grant 7,434,131 - Mukherjee , et al. October 7, 2	2008-10-07
Built-in self-test of integrated circuits using selectable weighting of test patterns App 20080235544 - Lai; Liyang ; et al.	2008-09-25
Programmable memory built-in-self-test (MBIST) method and apparatus Grant 7,428,680 - Mukherjee , et al. September 23, 2	2008-09-23
Performing memory built-in-self-test (MBIST) Grant 7,426,668 - Mukherjee , et al. September 16, 2	2008-09-16
Synchronization point across different memory BIST controllers Grant 7,424,660 - Kebichi , et al. September 9, 2	2008-09-09
Generating test sets for diagnosing scan chain failures App 20080215943 - Guo; Ruifeng ; et al.	2008-09-04
Using constrained scan cells to test integrated circuits App 20080201670 - Rinderknecht; Thomas Hans ; et al.	2008-08-21
Removing the effects of unknown test values from compacted test responses Grant 7,395,473 - Cheng , et al. July 1, 2	2008-07-01
Defect Localization Based On Defective Cell Diagnosis App 20080111558 - Sharma; Manish ; et al.	2008-05-15
Diagnosing Mixed Scan Chain And System Logic Defects App 20080040637 - Huang; Yu ; et al.	2008-02-14
Compactor Independent Fault Diagnosis App 20070283202 - Cheng; Wu-Tung ; et al.	2007-12-06
Using constrained scan cells to test integrated circuits Grant 7,296,249 - Rinderknecht , et al. November 13, 2	2007-11-13
Multi-stage test response compactors App 20070234157 - Rajski; Janusz ; et al.	2007-10-04
Speeding Up Defect Diagnosis Techniques App 20070226570 - Zou; Wei ; et al.	2007-09-27
Enhanced diagnosis with limited failure cycles App 20070220381 - Huang; Yu ; et al.	2007-09-20
Compactor independent fault diagnosis Grant 7,239,978 - Cheng , et al. July 3, 2	2007-07-03
Direct fault diagnostics using per-pattern compactor signatures App 20070100586 - Cheng; Wu-Tung ; et al.	2007-05-03
Built-in self-analyzer for embedded memory Grant 7,200,786 - Cheng , et al. April 3, 2	2007-04-03
Reduced-pin-count-testing architectures for applying test patterns App 20070011542 - Mukherjee; Nilanjan ; et al.	2007-01-11
Synchronization point across different memory BIST controllers App 20060190789 - Kebichi; Omar ; et al.	2006-08-24
Flexible memory built-in-self-test (MBIST) method and apparatus App 20060156133 - Mukherjee; Nilanjan ; et al.	2006-07-13
Removing the effects of unknown test values from compacted test responses App 20060156144 - Cheng; Wu-Tung ; et al.	2006-07-13
Programmable memory built-in-self-test (MBIST) method and apparatus App 20060156134 - Mukherjee; Nilanjan ; et al.	2006-07-13
Performing memory built-in-self-test (MBIST) App 20060146622 - Mukherjee; Nilanjan ; et al.	2006-07-06
Compactor independent direct diagnosis of test hardware App 20060111873 - Huang; Yu ; et al.	2006-05-25
Synchronization point across different memory BIST controllers Grant 7,036,064 - Kebichi , et al. April 25, 2	2006-04-25
Compactor independent fault diagnosis App 20050222816 - Cheng, Wu-Tung ; et al.	2005-10-06
Scheduling the concurrent testing of multiple cores embedded in an integrated circuit Grant 6,934,897 - Mukherjee , et al. August 23, 2	2005-08-23
Using constrained scan cells to test integrated circuits App 20050081130 - Rinderknecht, Thomas Hans ; et al.	2005-04-14
Full-speed BIST controller for testing embedded synchronous memories App 20050066247 - Cheng, Wu-Tung ; et al.	2005-03-24
Full-speed BIST controller for testing embedded synchronous memories Grant 6,829,728 - Cheng , et al. December 7, 2	2004-12-07
Built-in self-analyzer for embedded memory App 20040210803 - Cheng, Wu-Tung ; et al.	2004-10-21
Testing embedded memories in an integrated circuit App 20040190331 - Ross, Don E. ; et al.	2004-09-30
Scheduling the concurrent testing of multiple cores embedded in an integrated circuit App 20030191996 - Mukherjee, Nilanjan ; et al.	2003-10-09
Method and apparatus for creating testable circuit designs having embedded cores Grant 6,456,961 - Patil , et al. September 24, 2	2002-09-24
Full-speed bist controller for testing embedded synchronous memories App 20020059543 - Cheng, Wu-Tung ; et al.	2002-05-16