loadpatents
name:-0.035991907119751
name:-0.039493799209595
name:-0.01275897026062
Cheng; Nai-Han Patent Filings

Cheng; Nai-Han

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cheng; Nai-Han.The latest application filed is for "broadband wafer defect detection".

Company Profile
11.41.42
  • Cheng; Nai-Han - Zhudong Township TW
  • CHENG; Nai-Han - Hsinchu County TW
  • Cheng; Nai-Han - Hsinchu TW
  • Cheng; Nai-Han - Hsin-Chu TW
  • CHENG; Nai-Han - Hsinchu City TW
  • - Hsinchu County TW
  • Cheng; Nai-Han - Hsin-Chu City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Ion implantation system and source bushing thereof
Grant 11,282,673 - Meng , et al. March 22, 2
2022-03-22
Broadband Wafer Defect Detection
App 20210333220 - CHENG; Nai-Han ;   et al.
2021-10-28
Ion Implantation Gas Supply System
App 20210319978 - Hsu; Hsing-Piao ;   et al.
2021-10-14
Ion impantation gas supply system
Grant 11,081,315 - Hsu , et al. August 3, 2
2021-08-03
3D IC bump height metrology APC
Grant 11,075,097 - Cheng , et al. July 27, 2
2021-07-27
Broadband wafer defect detection
Grant 11,060,980 - Cheng , et al. July 13, 2
2021-07-13
Method For Manufacturing Semiconductor Structure
App 20200402806 - CHENG; NAI-HAN ;   et al.
2020-12-24
Ion Impantation Gas Supply System
App 20200395193 - HSU; Hsing-Piao ;   et al.
2020-12-17
Ion Implantation System And Source Bushing Thereof
App 20200381210 - MENG; Ying-Chieh ;   et al.
2020-12-03
Ion implantation system and source bushing thereof
Grant 10,784,079 - Meng , et al. Sept
2020-09-22
Semiconductor manufacturing apparatus and method thereof
Grant 10,763,117 - Cheng , et al. Sep
2020-09-01
3d Ic Bump Height Metrology Apc
App 20200152495 - Cheng; Nai-Han ;   et al.
2020-05-14
Ion Implantation System And Source Bushing Thereof
App 20200098544 - MENG; Ying-Chieh ;   et al.
2020-03-26
3D IC bump height metrology APC
Grant 10,541,164 - Cheng , et al. Ja
2020-01-21
Broadband Wafer Defect Detection
App 20190162676 - CHENG; Nai-Han ;   et al.
2019-05-30
3d Ic Bump Height Metrology Apc
App 20190139800 - Cheng; Nai-Han ;   et al.
2019-05-09
Ion beam source for semiconductor ion implantation
Grant 10,269,530 - Hsu , et al.
2019-04-23
3D IC bump height metrology APC
Grant 10,181,415 - Cheng , et al. Ja
2019-01-15
Semiconductor Manufacturing Apparatus And Method Thereof
App 20180166291 - CHENG; NAI-HAN ;   et al.
2018-06-14
3d Ic Bump Height Metrology Apc
App 20180096872 - Cheng; Nai-Han ;   et al.
2018-04-05
Defect inspection and repairing method and associated system and non-transitory computer readable medium
Grant 9,929,045 - Cheng , et al. March 27, 2
2018-03-27
Wafer processing system using multi-zone chuck
Grant 9,892,954 - Cheng , et al. February 13, 2
2018-02-13
Semiconductor manufacturing apparatus and method thereof
Grant 9,892,931 - Cheng , et al. February 13, 2
2018-02-13
Defect Inspection And Repairing Method And Associated System And Non-transitory Computer Readable Medium
App 20180019166 - CHENG; NAI-HAN ;   et al.
2018-01-18
Ion implantation with charge and direction control
Grant 9,865,429 - Hwang , et al. January 9, 2
2018-01-09
3D IC bump height metrology APC
Grant 9,859,139 - Cheng , et al. January 2, 2
2018-01-02
Ion beam dimension control for ion implantation process and apparatus, and advanced process control
Grant 9,805,913 - Hwang , et al. October 31, 2
2017-10-31
3d Ic Bump Height Metrology Apc
App 20170018445 - Cheng; Nai-Han ;   et al.
2017-01-19
Method for monitoring ion implantation
Grant 9,449,889 - Chang , et al. September 20, 2
2016-09-20
Method and apparatus for controlling beam angle during ion implantation of a semiconductor wafer based upon pressure
Grant 9,315,892 - Cheng , et al. April 19, 2
2016-04-19
Substrate rapid thermal heating system and methods
Grant 9,239,192 - Cheng , et al. January 19, 2
2016-01-19
Beam monitoring device, method, and system
Grant 9,218,938 - Cheng December 22, 2
2015-12-22
Ion Beam Dimension Control For Ion Implantation Process And Apparatus, And Advanced Process Control
App 20150270103 - HWANG; Chih-Hong ;   et al.
2015-09-24
Method for Monitoring Ion Implantation
App 20150221561 - Chang; Chun-Lin ;   et al.
2015-08-06
Ion beam dimension control for ion implantation process and apparatus, and advanced process control
Grant 9,070,534 - Hwang , et al. June 30, 2
2015-06-30
Dosage accuracy monitoring systems of implanters
Grant 9,048,069 - Chen , et al. June 2, 2
2015-06-02
Multi-factor advanced process control method and system for integrated circuit fabrication
Grant 9,031,684 - Cheng , et al. May 12, 2
2015-05-12
Semiconductor Manufacturing Apparatus And Method Thereof
App 20150104949 - CHENG; NAI-HAN ;   et al.
2015-04-16
Apparatus for monitoring ion implantation
Grant 9,006,676 - Chang , et al. April 14, 2
2015-04-14
ION Implantation with Charge and Direction Control
App 20150069913 - Hwang; Chih-Hong ;   et al.
2015-03-12
Ion implantation with charge and direction control
Grant 8,922,122 - Hwang , et al. December 30, 2
2014-12-30
Ion implantation with charge and direction control
Grant 08922122 -
2014-12-30
Beam Monitoring Device, Method, and System
App 20140306119 - Hwang; Chih-Hong ;   et al.
2014-10-16
Ion Implantation
App 20140273420 - Cheng; Nai-Han ;   et al.
2014-09-18
Substrate Rapid Thermal Heating System And Methods
App 20140235071 - CHENG; Nai-Han ;   et al.
2014-08-21
Wafer Processing System Using Multi-zone Chuck
App 20140202383 - CHENG; Nai-Han ;   et al.
2014-07-24
Beam monitoring device, method, and system
Grant 8,766,207 - Hwang , et al. July 1, 2
2014-07-01
Wafer processing method and system using multi-zone chuck
Grant 8,709,528 - Cheng , et al. April 29, 2
2014-04-29
Multi-ion beam implantation apparatus and method
Grant 8,592,785 - Cheng , et al. November 26, 2
2013-11-26
Apparatus for monitoring ion implantation
Grant 8,581,204 - Chang , et al. November 12, 2
2013-11-12
Ion Beam Dimension Control For Ion Implantation Process And Apparatus, And Advanced Process Control
App 20130295753 - HWANG; Chih-Hong ;   et al.
2013-11-07
Apparatus for Monitoring Ion Implantation
App 20130280823 - Chang; Chun-Lin ;   et al.
2013-10-24
Wafer Processing Method And System Using Multi-zone Chuck
App 20130171336 - CHENG; Nai-Han ;   et al.
2013-07-04
Ion Implantation With Charge And Direction Control
App 20130140987 - Hwang; Chih-Hong ;   et al.
2013-06-06
Multi-factor Advanced Process Control Method And System For Integrated Circuit Fabrication
App 20130110276 - Cheng; Nai-Han ;   et al.
2013-05-02
Multi-ion Beam Implantation Apparatus And Method
App 20130075623 - CHENG; Nai-Han ;   et al.
2013-03-28
Beam Monitoring Device, Method, And System
App 20130075624 - Hwang; Chih-Hong ;   et al.
2013-03-28
Apparatus for Monitoring Ion Implantation
App 20130068960 - Chang; Chun-Lin ;   et al.
2013-03-21
Method and system for controlling an implantation process
Grant 8,241,924 - Cheng , et al. August 14, 2
2012-08-14
Shallow junction formation and high dopant activation rate of MOS devices
Grant 8,212,253 - Nieh , et al. July 3, 2
2012-07-03
Shallow Junction Formation and High Dopant Activation Rate of MOS Devices
App 20110316079 - Nieh; Chun-Feng ;   et al.
2011-12-29
Junction profile engineering using staged thermal annealing
Grant 8,058,134 - Wang , et al. November 15, 2
2011-11-15
Shallow junction formation and high dopant activation rate of MOS devices
Grant 8,039,375 - Nieh , et al. October 18, 2
2011-10-18
Method And System For Controlling An Implantation Process
App 20100221849 - Cheng; Nai-Han ;   et al.
2010-09-02
Junction Profile Engineering Using Staged Thermal Annealing
App 20100210086 - Wang; Li-Ting ;   et al.
2010-08-19
Dosage accuracy monitoring systems of implanters
App 20080296472 - Chen; Juan-Lin ;   et al.
2008-12-04
Shallow junction formation and high dopant activation rate of MOS devices
App 20080293204 - Nieh; Chun-Feng ;   et al.
2008-11-27
Systems and methods for implant dosage control
Grant 7,385,208 - Cheng , et al. June 10, 2
2008-06-10
Systems and methods for implant dosage control
App 20070023695 - Cheng; Nai-Han ;   et al.
2007-02-01

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