loadpatents
Patent applications and USPTO patent grants for CHENG; Chih-Feng.The latest application filed is for "testing system, crack noise monitoring device and method for monitoring crack noise".
Patent | Date |
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Testing System, Crack Noise Monitoring Device And Method For Monitoring Crack Noise App 20220293121 - LIAO; Chih-Chieh ;   et al. | 2022-09-15 |
Testing Apparatus And Its Element Pickup Module App 20220291256 - LIAO; Chih-Chieh ;   et al. | 2022-09-15 |
Thermal Peak Suppression Device App 20220270953 - LIAO; Chih-Chieh ;   et al. | 2022-08-25 |
Testing Equipment, Its Component Carrying Device And Testing Method Of The Testing Equipment App 20220178990 - LIAO; Chih-Chieh ;   et al. | 2022-06-09 |
Testing equipment, its component carrying device and testing method of the testing equipment Grant 11,340,288 - Liao , et al. May 24, 2 | 2022-05-24 |
Testing Apparatus App 20220136724 - Liao; Chih-Chieh ;   et al. | 2022-05-05 |
Inspecting Device App 20220136816 - Liao; Chih-Chieh ;   et al. | 2022-05-05 |
Cable end connector Grant 11,289,840 - Hsiao , et al. March 29, 2 | 2022-03-29 |
Circuit board assembly and cable Grant 11,227,705 - Hsiao , et al. January 18, 2 | 2022-01-18 |
Probe card module Grant 11,156,639 - Liao , et al. October 26, 2 | 2021-10-26 |
Probe Card Module App 20210223290 - Liao; Chih-Chieh ;   et al. | 2021-07-22 |
Circuit Board Structure And Connector Comprising The Same App 20210175650 - HSIAO; Hsin Tuan ;   et al. | 2021-06-10 |
Flexible flat cable comprising conductor layers disposed on opposite sides of a metal isolation layer Grant 10,978,770 - Hsiao , et al. April 13, 2 | 2021-04-13 |
Circuit Board Assembly with High-Speed Cable App 20210065932A1 - | 2021-03-04 |
Color Sensing Module App 20200370956 - Chou; Yi-Chia ;   et al. | 2020-11-26 |
Flexible Flat Cable Structure App 20200161024 - HSIAO; Hsin-Tuan ;   et al. | 2020-05-21 |
High Frequency Flexible Flat Cable App 20200161733 - HSIAO; Hsin-Tuan ;   et al. | 2020-05-21 |
Moveable hook apparatus Grant 10,631,670 - Lo , et al. | 2020-04-28 |
Testing system for semiconductor package components and its thermal barrier layer element Grant 10,598,724 - Liao , et al. | 2020-03-24 |
Drying apparatus Grant 10,566,217 - Liao , et al. Feb | 2020-02-18 |
Testing equipment for semiconductor element and its carrying device Grant 10,502,775 - Liao , et al. Dec | 2019-12-10 |
Drying Apparatus App 20190304810 - LIAO; Chih-Chieh ;   et al. | 2019-10-03 |
Probe card system, probe loader device and manufacturing method of the probe loader device Grant 10,274,516 - Liao , et al. | 2019-04-30 |
Testing System For Semiconductor Package Components And Its Thermal Barrier Layer Element App 20190064258 - LIAO; Chih-Chieh ;   et al. | 2019-02-28 |
Testing Equipment For Semiconductor Element And Its Carrying Device App 20190064247 - LIAO; Chih-Chieh ;   et al. | 2019-02-28 |
Electronic device having active heat dissipation Grant 10,154,612 - Sun , et al. Dec | 2018-12-11 |
Testing apparatus and its probe connector Grant 10,132,835 - Liao , et al. November 20, 2 | 2018-11-20 |
Probe Card System, Probe Loader Device And Manufacturing Method Of The Probe Loader Device App 20180321278 - LIAO; Chih-Chieh ;   et al. | 2018-11-08 |
Probe card device Grant 10,048,290 - Liao , et al. August 14, 2 | 2018-08-14 |
Damping component and integrated-circuit testing apparatus using the same Grant 10,041,817 - Liao , et al. August 7, 2 | 2018-08-07 |
Damping Component And Integrated-circuit Testing Apparatus Using The Same App 20180087936 - LIAO; Chih-Chieh ;   et al. | 2018-03-29 |
Testing Apparatus And Its Probe Connector App 20180038892 - LIAO; Chih-Chieh ;   et al. | 2018-02-08 |
Probe Card Device App 20170269126 - LIAO; Chih-Chieh ;   et al. | 2017-09-21 |
Probe card Grant 9,678,110 - Liao , et al. June 13, 2 | 2017-06-13 |
Testing Unit And Testing Apparatus Using The Same App 20170052218 - LIAO; Chih-Chieh ;   et al. | 2017-02-23 |
Circuit Probing System And Its Circuit Probing Device App 20170045554 - LIAO; Chih-Chieh ;   et al. | 2017-02-16 |
Probe Card App 20170010305 - LIAO; Chih-Chieh ;   et al. | 2017-01-12 |
Method and control board for eliminating power-off residual images in display and display using the same Grant 8,537,150 - Cheng , et al. September 17, 2 | 2013-09-17 |
Burn-in socket and testing fixture using the same Grant 8,487,642 - Sun , et al. July 16, 2 | 2013-07-16 |
Burn-in socket and testing fixture using the same App 20120025860 - Sun; Yu-Min ;   et al. | 2012-02-02 |
Image Capturing Device And Manufacturing Method Of Sealing Structure App 20100295989 - Cheng; Chih-Feng | 2010-11-25 |
Optical burst mode receiver Grant 7,660,538 - Tunmu , et al. February 9, 2 | 2010-02-09 |
Method And Control Board For Eliminating Power-off Residual Images In Display And Display Using The Same App 20100026673 - Cheng; Chih-Feng ;   et al. | 2010-02-04 |
High-voltage pulse protection device and video apparatus deployment thereof Grant 7,630,187 - Lin , et al. December 8, 2 | 2009-12-08 |
High-Voltage Pulse Protection Device and Video Apparatus Deployment Thereof App 20070279826 - LIN; Yung-Da ;   et al. | 2007-12-06 |
Optical burst mode receiver App 20070154226 - Tunmu; Chia Cheih ;   et al. | 2007-07-05 |
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