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Patent applications and USPTO patent grants for Chen; Yuan-Chuan Steven.The latest application filed is for "apparatus and method to monitor die edge defects".
Patent | Date |
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Apparatus and method to monitor die edge defects Grant 10,026,664 - Xie , et al. July 17, 2 | 2018-07-17 |
Apparatus And Method To Monitor Die Edge Defects App 20170141006 - Xie; Mayue ;   et al. | 2017-05-18 |
Apparatus and method to monitor die edge defects Grant 9,564,381 - Xie , et al. February 7, 2 | 2017-02-07 |
Apparatus And Method To Monitor Die Edge Defects App 20160043011 - Xie; Mayue ;   et al. | 2016-02-11 |
Apparatus and method to monitor die edge defects Grant 9,159,646 - Xie , et al. October 13, 2 | 2015-10-13 |
Apparatus And Method To Monitor Die Edge Defects App 20140168879 - Xie; Mayue ;   et al. | 2014-06-19 |
Integrated circuit testing with laser stimulation and emission analysis Grant 7,777,507 - Bockelman , et al. August 17, 2 | 2010-08-17 |
Integrated Circuit Testing With Laser Stimulation And Emission Analysis App 20080238435 - Bockelman; Daniel Richard ;   et al. | 2008-10-02 |
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