Chen; Ying-Yen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Ying-Yen.The latest application filed is for "reliability detection device and reliability detection method".

Company Profile

12.18.22

Chen; Ying-Yen - Hsinchu TW
Chen; Ying-Yen - Hsinchu City TW
Chen; Ying-Yen - Chiayi County TW
Chen; Ying-Yen - Chia Yi County N/A TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Reliability detection device and reliability detection method Grant 11,451,222 - Hsu , et al. September 20, 2	2022-09-20
Reliability Detection Device And Reliability Detection Method App 20220247399 - HSU; WEN-HSUAN ; et al.	2022-08-04
Device for detecting margin of circuit operating at certain speed App 20220036962 - KUO; CHUN-YI ; et al.	2022-02-03
Electronic device test database generating method and electronic device test database generating apparatus Grant 11,163,003 - Chen , et al. November 2, 2	2021-11-02
Wafer testing machine and method for training artificial intelligence model to test wafer App 20210287086 - CHERN; YIN-PING ; et al.	2021-09-16
Circuit testing system and circuit testing method Grant 11,073,555 - Chen , et al. July 27, 2	2021-07-27
Circuit having multiple scan modes for testing Grant 11,073,558 - Wu , et al. July 27, 2	2021-07-27
Circuit testing system and circuit testing method Grant 11,061,073 - Chen , et al. July 13, 2	2021-07-13
Test Pattern Generating Method, Test Pattern Generating Device And Fault Model Generating Method App 20210132147 - Chen; Ying-Yen ; et al.	2021-05-06
Measuring circuit for quantizing variations in circuit operating speed Grant 10,763,836 - Kuo , et al. Sep	2020-09-01
Circuit Testing System And Circuit Testing Method App 20200217887 - CHEN; Ying-Yen ; et al.	2020-07-09
Circuit Testing System And Circuit Testing Method App 20200217886 - Chen; Ying-Yen ; et al.	2020-07-09
Circuit operating speed detecting circuit App 20200212900 - KUO; CHUN-YI ; et al.	2020-07-02
Measuring circuit for quantizing variations in circuit operating speed App 20200212901 - KUO; CHUN-YI ; et al.	2020-07-02
Circuit operating speed detecting circuit Grant 10,686,433 - Kuo , et al.	2020-06-16
Circuit Applied To Multiple Scan Modes For Testing App 20200182933 - Wu; Tzung-Jin ; et al.	2020-06-11
Test device for testing integrated circuit Grant 10,605,861 - Chen , et al.	2020-03-31
Integrated circuit test method Grant 10,496,505 - Hsu , et al. De	2019-12-03
Electronic Device Test Database Generating Method And Electronic Device Test Database Generating Apparatus App 20190346508 - Chen; Po-Lin ; et al.	2019-11-14
Electronic apparatus and control method thereof Grant 10,416,233 - Kuo , et al. Sept	2019-09-17
Test device for testing integrated circuit App 20190120901 - CHEN; PO-LIN ; et al.	2019-04-25
Debugging method executed via scan chain for scan test and related circuitry system Grant 10,234,503 - Kuo , et al.	2019-03-19
Electronic Apparatus And Control Method Thereof App 20180210029 - KUO; Chun-Yi ; et al.	2018-07-26
Integrated Circuit Test Method App 20180181477 - HSU; WEN-HSUAN ; et al.	2018-06-28
Voltage And Frequency Scaling Apparatus, System On Chip And Voltage And Frequency Scaling Method App 20180052506 - KUO; Chun-Yi ; et al.	2018-02-22
Debugging Method Executed Via Scan Chain For Scan Test And Related Circuitry System App 20170176522 - Kuo; Chun-Yi ; et al.	2017-06-22
Method of integrated circuit scan clock domain allocation and machine readable media thereof Grant 9,568,553 - Wu , et al. February 14, 2	2017-02-14
Estimation apparatus and method for estimating clock skew Grant 9,274,543 - Chen , et al. March 1, 2	2016-03-01
Clock edge detection device and method Grant 9,160,322 - Lo , et al. October 13, 2	2015-10-13
Clock edge detection device and method App 20150022242 - LO; Yu-Cheng ; et al.	2015-01-22
Delay difference detection and adjustment device and method Grant 8,907,709 - Lo , et al. December 9, 2	2014-12-09
Element measurement circuit and method thereof Grant 8,901,917 - Chen , et al. December 2, 2	2014-12-02
Scan Clock Generator And Related Method Thereof App 20140129885 - Chen; Ying-Yen ; et al.	2014-05-08
Method Of Integrated Circuit Scan Clock Domain Allocation And Machine Readable Media Thereof App 20140091812 - Wu; Ming-Chung ; et al.	2014-04-03
Estimation Apparatus And Method For Estimating Clock Skew App 20130282318 - Chen; Ying-Yen ; et al.	2013-10-24
Configurable Process Variation Monitoring Circuit of Die and Monitoring Method Thereof App 20120326701 - CHEN; YING-YEN ; et al.	2012-12-27
Element Measurement Circuit And Method Thereof App 20120274310 - CHEN; Ying-Yen ; et al.	2012-11-01

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