Chen; Xinfen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Xinfen.The latest application filed is for "selective plasma etch of top electrodes for metal-insulator-metal (mim) capacitors".

Company Profile

0.7.6

Chen; Xinfen - Plano TX US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
CMP process for processing STI on two distinct silicon planes Grant 8,551,886 - Hunt , et al. October 8, 2	2013-10-08
Buried floating layer structure for improved breakdown Grant 8,264,038 - Pendharkar , et al. September 11, 2	2012-09-11
Forming integrated circuit devices with metal-insulator-metal capacitors using selective etch of top electrodes Grant 8,110,414 - Cathey, Jr. , et al. February 7, 2	2012-02-07
Selective Plasma Etch Of Top Electrodes For Metal-insulator-metal (mim) Capacitors App 20100276783 - CATHEY; MARSHALL O. ; et al.	2010-11-04
Buried Floating Layer Structure For Improved Breakdown App 20100032756 - PENDHARKAR; Sameer P. ; et al.	2010-02-11
Integrated circuit capacitor having antireflective dielectric Grant 7,595,525 - Wofford , et al. September 29, 2	2009-09-29
Cmp Process For Processing Sti On Two Distinct Silicon Planes App 20090170317 - Hunt; Kyle P. ; et al.	2009-07-02
Integrated Circuit Capacitor Having Antireflective Dielectric App 20070105332 - Wofford; Bill Alan ; et al.	2007-05-10
Integrated circuit capacitor having antireflective dielectric Grant 7,118,959 - Wofford , et al. October 10, 2	2006-10-10
Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devices Grant 7,112,953 - Chen , et al. September 26, 2	2006-09-26
Integrated Circuit Capacitor Having Antireflective Dielectric App 20060205140 - Wofford; Bill Alan ; et al.	2006-09-14
Method for detecting EPI induced buried layer shifts in semiconductor devices App 20060038553 - Chen; Xinfen ; et al.	2006-02-23

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