Chen; Tzung-Te
Patent Applications and Registrations
Patent applications and USPTO patent grants for Chen; Tzung-Te.The latest application filed is for "light source apparatus and display apparatus".
- Chen; Tzung-Te - Taipei TW
- Chen; Tzung-Te - Taichung TW
- Chen; Tzung-Te - Taipei City TW
- Chen; Tzung-Te - Hsinchu TW
| Patent | Date |
|---|---|
| Light source apparatus and display apparatus Grant 10,838,253 - Chen , et al. November 17, 2 | 2020-11-17 |
| Light source apparatus and display apparatus Grant 10,820,387 - Lai , et al. October 27, 2 | 2020-10-27 |
| Light Source Apparatus And Display Apparatus App 20200077486 - LAI; BING-YUAN ; et al. | 2020-03-05 |
| Light Source Apparatus And Display Apparatus App 20200057339 - Chen; Tzung-Te ; et al. | 2020-02-20 |
| Light source apparatus and display apparatus Grant 10,485,070 - Chen , et al. Nov | 2019-11-19 |
| Method, device and computer program product for controlling lights Grant 10,271,410 - Wang , et al. | 2019-04-23 |
| Light Source Apparatus And Display Apparatus App 20180317296 - Chen; Tzung-Te ; et al. | 2018-11-01 |
| Light source apparatus Grant 10,039,169 - Chen , et al. July 31, 2 | 2018-07-31 |
| Illumination system and method for developing target visual perception of an object Grant 9,992,842 - Chiang , et al. June 5, 2 | 2018-06-05 |
| Apparatus for measuring a curvature of a thin film and the method thereof Grant 9,970,880 - Chen , et al. May 15, 2 | 2018-05-15 |
| Apparatus For Measuring A Curvature Of A Thin Film And The Method Thereof App 20180052115 - Chen; Tzung-Te ; et al. | 2018-02-22 |
| Light Source Apparatus App 20170325310 - Chen; Tzung-Te ; et al. | 2017-11-09 |
| Testing method and testing system for semiconductor element Grant 9,726,713 - Chen , et al. August 8, 2 | 2017-08-08 |
| Illumination System And Method For Developing Target Visual Perception Of An Object App 20170111973 - Chiang; Ya-Hui ; et al. | 2017-04-20 |
| Method of measuring thermal electric characteristics of semiconductor device Grant 9,557,368 - Wang , et al. January 31, 2 | 2017-01-31 |
| Thin-film curvature measurement apparatus and method thereof Grant 9,523,572 - Chen , et al. December 20, 2 | 2016-12-20 |
| Thin-film Curvature Measurement Apparatus And Method Thereof App 20160169666 - CHEN; Tzung-Te ; et al. | 2016-06-16 |
| Testing apparatus Grant 9,341,669 - Wang , et al. May 17, 2 | 2016-05-17 |
| Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device Grant 9,110,125 - Wang , et al. August 18, 2 | 2015-08-18 |
| Inspection method Grant 8,773,158 - Wang , et al. July 8, 2 | 2014-07-08 |
| Testing Method And Testing System For Semiconductor Element App 20140107961 - Chen; Tzung-Te ; et al. | 2014-04-17 |
| Method Of Measuring Thermal Electric Characteristics Of Semiconductor Device App 20140049260 - WANG; Chien-Ping ; et al. | 2014-02-20 |
| Method And Apparatus For Detecting Semiconductor Device Property App 20140049283 - Wang; Chien-Ping ; et al. | 2014-02-20 |
| Testing Apparatus App 20140015531 - Wang; Chien-Ping ; et al. | 2014-01-16 |
| Inspection Method App 20120169345 - Wang; Chien-Ping ; et al. | 2012-07-05 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 