| Patent | Date |
|---|
Conductor structure and display device
Grant 10,756,121 - Chen , et al. A | 2020-08-25 |
Lens Assembly Module With Light Shielding Film
App 20190187340 - Jheng; Yu-Teng ; et al. | 2019-06-20 |
Conductor Structure And Display Device
App 20180261629 - Chen; Ming-Chun ; et al. | 2018-09-13 |
Capacitance modification without affecting die area
Grant 8,627,259 - Huang , et al. January 7, 2 | 2014-01-07 |
Adjusting capacitance of capacitors without affecting die area
Grant 8,627,258 - Huang , et al. January 7, 2 | 2014-01-07 |
Capacitance modification without affecting die area
App 20120329179 - Huang; Peter ; et al. | 2012-12-27 |
Adjusting Capacitance of Capacitors without Affecting Die Area
App 20120315711 - Huang; Peter ; et al. | 2012-12-13 |
Method for adjusting capacitance of capacitors without affecting die area
Grant 8,255,858 - Huang , et al. August 28, 2 | 2012-08-28 |
Method for adjusting capacitance of capacitors without affecting die area
App 20100125989 - Huang; Peter ; et al. | 2010-05-27 |
Method of controlling signal transmission in a local area network
Grant 7,477,631 - Chen , et al. January 13, 2 | 2009-01-13 |
Multipurpose charging system with transmission function
App 20060179165 - Chen; Ming-Chun | 2006-08-10 |
Method of controlling signal transmission in a local area network
App 20050094557 - Chen, Ming-Chun ; et al. | 2005-05-05 |
Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring
Grant 6,603,559 - Tsao , et al. August 5, 2 | 2003-08-05 |
Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring
App 20030072005 - Tsao, Shyh-Lin ; et al. | 2003-04-17 |
Method to accurately determine classification codes for defects during semiconductor manufacturing
Grant 6,185,511 - Steffan , et al. February 6, 2 | 2001-02-06 |
Critical area cost disposition feedback system
Grant 6,174,738 - Steffan , et al. January 16, 2 | 2001-01-16 |
System for process data association using LaPlace Everett interpolation
Grant 6,098,024 - Chen , et al. August 1, 2 | 2000-08-01 |
Automatic recipe adjust and download based on process control window
Grant 6,041,270 - Steffan , et al. March 21, 2 | 2000-03-21 |
Automatic defect reclassification of known propagator defects
Grant 6,035,244 - Chen , et al. March 7, 2 | 2000-03-07 |
Semiconductor wafer optical scanning system and method using swath-area defect limitation
Grant 6,011,619 - Steffan , et al. January 4, 2 | 2000-01-04 |
Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification
Grant 5,999,003 - Steffan , et al. December 7, 1 | 1999-12-07 |
Automatic defect classification (ADC) reclassification engine
Grant 5,966,459 - Chen , et al. October 12, 1 | 1999-10-12 |
Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer
Grant 5,917,332 - Chen , et al. June 29, 1 | 1999-06-29 |
Vehicle communication device
Grant 5,905,434 - Steffan , et al. May 18, 1 | 1999-05-18 |
Dynamic process window control using simulated wet data from current and previous layer data
Grant 5,866,437 - Chen , et al. February 2, 1 | 1999-02-02 |
Automatic defect classification individual defect predicate value retention
Grant 5,862,055 - Chen , et al. January 19, 1 | 1999-01-19 |
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