loadpatents
name:-0.012804985046387
name:-0.0060200691223145
name:-0.00051116943359375
Chen; Lee Jen Patent Filings

Chen; Lee Jen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Lee Jen.The latest application filed is for "memory device and manufacturing method thereof".

Company Profile
0.4.10
  • Chen; Lee Jen - Taipei TW
  • Chen; Lee-Jen - Taipei City TW
  • Chen; Lee-Jen - Hsinchu TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
UV blocking and crack protecting passivation layer
Grant 7,755,197 - Chen , et al. July 13, 2
2010-07-13
UV blocking and crack protecting passivation layer fabricating method
Grant 7,662,712 - Chen , et al. February 16, 2
2010-02-16
Memory Device And Manufacturing Method Thereof
App 20090032856 - Chen; Lee-Jen ;   et al.
2009-02-05
UV blocking and crack protecting passivation layer fabricating method
App 20070190806 - Chen; Lee Jen ;   et al.
2007-08-16
UV blocking and crack protecting passivation layer
App 20070187813 - Chen; Lee Jen ;   et al.
2007-08-16
Spin-on glass passivation process
App 20070128887 - Chen; Lee-Jen ;   et al.
2007-06-07
Method for preventing metal line bridging in a semiconductor device
App 20060292774 - Chen; Lee-Jen ;   et al.
2006-12-28
Method for improving SOG process
App 20060237802 - Chen; Lee-Jen ;   et al.
2006-10-26
Semiconductor Process And Method Of Fabricating Inter-layer Dielectric
App 20060121723 - Su; Chin-Ta ;   et al.
2006-06-08
Method for mitigating chemical vapor deposition phosphorus doping oxide surface induced defects
App 20050054214 - Chen, Lee Jen ;   et al.
2005-03-10
Shallow Trench Isolation Process
App 20040121555 - HUNG, YUNG-TAI ;   et al.
2004-06-24
Shallow trench isolation process
Grant 6,750,117 - Hung , et al. June 15, 2
2004-06-15
Methods for filling shallow trench isolations having high aspect ratios
Grant 6,713,365 - Lin , et al. March 30, 2
2004-03-30
Methods For Filling Shallow Trench Isolations Having High Aspect Ratios
App 20040043581 - Lin, Chin-Hsiang ;   et al.
2004-03-04

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed