Chen; Kuei-Pao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Kuei-Pao.The latest application filed is for "packaged chip detection and classification device".

Company Profile

0.19.17

Chen; Kuei-Pao - Hsin Chu TW
Chen; Kuei-Pao - Hsinchu County N/A TW
CHEN; Kuei-Pao - HSIN CHU CITY TW
Chen; Kuei-Pao - Hsinchu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Packaged chip detection and classification device Grant 9,029,725 - Wang , et al. May 12, 2	2015-05-12
Light-guiding cover structure Grant 8,873,920 - Wang , et al. October 28, 2	2014-10-28
LED package chip classification system Grant 8,710,387 - Wang , et al. April 29, 2	2014-04-29
Packaged chip detection and classification device Grant 8,686,310 - Wang , et al. April 1, 2	2014-04-01
Packaged Chip Detection And Classification Device App 20140048457 - WANG; Bily ; et al.	2014-02-20
Multi-track detection system for detecting the appearance of electronic elements Grant 8,525,524 - Wang , et al. September 3, 2	2013-09-03
Light-emitting element detection and classification device Grant 8,519,458 - Wang , et al. August 27, 2	2013-08-27
Light-guiding Cover Structure App 20130163922 - WANG; BILY ; et al.	2013-06-27
Light-emitting Element Detection And Classification Device App 20130015372 - WANG; BILY ; et al.	2013-01-17
Led Package Chip Classification System App 20120285869 - WANG; BILY ; et al.	2012-11-15
Multi-track Detection System For Detecting The Appearance Of Electronic Elements App 20120249156 - WANG; BILY ; et al.	2012-10-04
Packaged Chip Detection And Classification Device App 20120205297 - WANG; Bily ; et al.	2012-08-16
Detection system for detecting appearances of many electronic elements and methods of using the same Grant 8,107,720 - Wang , et al. January 31, 2	2012-01-31
Testing system and testing method for inspecting electonic devices Grant 8,031,930 - Wang , et al. October 4, 2	2011-10-04
Uniform light generating system for testing an image-sensing device and method of using the same Grant 7,898,663 - Wang , et al. March 1, 2	2011-03-01
Detection system for detecting appearances of many electronic elements and methods of using the same App 20100290664 - Wang; Bily ; et al.	2010-11-18
Optical object distance simulation device for reducing total optical path Grant 7,800,841 - Wang , et al. September 21, 2	2010-09-21
Die Defect Inspecting System With A Die Defect Inspecting Function And A Method Of Using The Same App 20100166290 - Wang; Bily ; et al.	2010-07-01
Testing system and testing method for inspecting electonic devices App 20090251815 - Wang; Bily ; et al.	2009-10-08
Optical object distance simulation device for reducing total optical path App 20090213474 - Wang; Bily ; et al.	2009-08-27
Uniform light generating system for testing an image-sensing device and method of using the same App 20090190124 - Wang; Bily ; et al.	2009-07-30
Optical object distance simulation device Grant 7,379,171 - Wang , et al. May 27, 2	2008-05-27
Uniform light generating system for adjusting output brightness and method of using the same Grant 7,329,028 - Wang , et al. February 12, 2	2008-02-12
Optical object distance simulation device App 20080002188 - Wang; Bily ; et al.	2008-01-03
Uniform Light Generating System For Adjusting Output Brightness And Method Of Using The Same App 20070297176 - Wang; Bily ; et al.	2007-12-27
Apparatus for measuring the static parameters of integrated circuits Grant 7,256,603 - Wang , et al. August 14, 2	2007-08-14
Method of integration testing for packaged electronic components Grant 7,163,829 - Chen , et al. January 16, 2	2007-01-16
Mass-production LED test device for mass production App 20060226848 - Lai; Tsan-Hsiung ; et al.	2006-10-12
Method of integration testing for packaged electronic components App 20060166380 - Chen; Kuei-Pao ; et al.	2006-07-27

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