loadpatents
name:-0.01894998550415
name:-0.010040044784546
name:-0.0064501762390137
Chen; Jyun-Hong Patent Filings

Chen; Jyun-Hong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Jyun-Hong.The latest application filed is for "hierarchical density uniformization for semiconductor feature surface planarization".

Company Profile
6.10.15
  • Chen; Jyun-Hong - Hsinchu TW
  • Chen; Jyun-Hong - Taichung TW
  • Chen; Jyun-Hong - Taichung City TW
  • Chen; Jyun-Hong - Taoyuan TW
  • Chen; Jyun-Hong - Taipei City TW
  • CHEN; Jyun-Hong - Taoyuan Hsien TW
  • Chen; Jyun-Hong - Taipei TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Hierarchical Density Uniformization For Semiconductor Feature Surface Planarization
App 20220075924 - Pratapa; Venkata Sripathi Sasanka ;   et al.
2022-03-10
Hierarchical density uniformization for semiconductor feature surface planarization
Grant 11,182,532 - Pratapa , et al. November 23, 2
2021-11-23
Semiconductor Wafer Measurement Method And System
App 20210342994 - CHEN; Peng-Ren ;   et al.
2021-11-04
Semiconductor wafer measurement method and system
Grant 11,094,057 - Chen , et al. August 17, 2
2021-08-17
Hierarchical Density Uniformization For Semiconductor Feature Surface Planarization
App 20210019465 - Pratapa; Venkata Sripathi Sasanka ;   et al.
2021-01-21
Semiconductor Wafer Measurement Method And System
App 20200364844 - CHEN; Peng-Ren ;   et al.
2020-11-19
Semiconductor wafer measurement method and system
Grant 10,762,621 - Chen , et al. Sep
2020-09-01
Systems And Methods For Systematic Physical Failure Analysis (pfa) Fault Localization
App 20200133959 - Chen; Peng-Ren ;   et al.
2020-04-30
Hydroxamic acid type contrast agent containing radioisotope fluoride, preparation method and application thereof
Grant 10,538,486 - Wang , et al. Ja
2020-01-21
Semiconductor Device Manufacturing Method And Associated Semiconductor Die
App 20200020655 - TSAI; MING-HO ;   et al.
2020-01-16
Semiconductor Wafer Measurement Method And System
App 20190259140 - CHEN; Peng-Ren ;   et al.
2019-08-22
Method and system for diagnosing a semiconductor wafer
Grant 10,304,178 - Chen , et al.
2019-05-28
Hydroxamic Acid Type Contrast Agent Containing Radioisotope Fluoride, Preparation Method And Application Thereof
App 20190106381 - WANG; MEI-HUI ;   et al.
2019-04-11
Bispecific peptide conjugate and radioactive bispecific peptide imaging agent
Grant 9,981,050 - Yu , et al. May 29, 2
2018-05-29
Bispecific Peptide Conjugate And Radioactive Bispecific Peptide Imaging Agent
App 20170095581 - YU; HUNG-MAN ;   et al.
2017-04-06
Method And System For Diagnosing A Semiconductor Wafer
App 20170084016 - CHEN; Peng-Ren ;   et al.
2017-03-23
Structure and method for E-beam in-chip overlay mark
Grant 9,230,867 - Cheng , et al. January 5, 2
2016-01-05
Structure and Method for E-Beam In-Chip Overlay Mark
App 20140256067 - Cheng; Dong-Hsu ;   et al.
2014-09-11
Structure and method for E-beam in-chip overlay mark
Grant 8,736,084 - Cheng , et al. May 27, 2
2014-05-27
Formic Acid Manufacturing System And Method Of Manufacturing Formic Acid
App 20120123157 - HUANG; Hsiao-Ping ;   et al.
2012-05-17
Liquid Crystal Display Apparatus, Backlight Module And Light Source Driving Device Thereof
App 20080231621 - CHANG; Yu-Ching ;   et al.
2008-09-25
Transesterification process of methyl acetate
Grant 7,399,881 - Huang , et al. July 15, 2
2008-07-15
Transesterification Process Of Methyl Acetate
App 20080161595 - Huang; Hsiao-Ping ;   et al.
2008-07-03

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