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Chen; Jie-Rong Patent Filings

Chen; Jie-Rong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Jie-Rong.The latest application filed is for "system and method for generating a scanning program for a stand-alone measuring equipment".

Company Profile
0.3.4
  • Chen; Jie-Rong - Shenzhen CN
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Three-dimensional collision detection system and method for a measuring machine
Grant 7,370,430 - Chang , et al. May 13, 2
2008-05-13
Three-dimensional Collision Detection System And Method For A Measuring Machine
App 20070144023 - CHANG; CHIH-KUANG ;   et al.
2007-06-28
System And Method For Generating A Scanning Program For A Stand-alone Measuring Equipment
App 20070150230 - CHANG; CHIH-KUANG ;   et al.
2007-06-28
System and method for generating a scanning program for a stand-alone measuring equipment
Grant 7,231,326 - Chang , et al. June 12, 2
2007-06-12
Method and system for cutting point cloud automatically
Grant 7,117,116 - Chang , et al. October 3, 2
2006-10-03
Method and system for simulative measurement demo
App 20060122804 - Chang; Chih-Kuang ;   et al.
2006-06-08
Method and system for cutting point cloud automatically
App 20060116838 - Chang; Chih-Kuang ;   et al.
2006-06-01

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