Chen; Hunglin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Hunglin.The latest application filed is for "method and apparatus for predicting yield of semiconductor devices".

Company Profile

1.6.10

Chen; Hunglin - Shanghai CN
Chen; Hunglin - Beijing CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And Apparatus For Predicting Yield Of Semiconductor Devices App 20220172070 - CHEN; Shanshan ; et al.	2022-06-02
Liquid fuel Grant 11,299,683 - Chen , et al. April 12, 2	2022-04-12
Liquid Fuel App 20210163836 - CHEN; Hunglin ; et al.	2021-06-03
Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device Grant 9,269,639 - Fan , et al. February 23, 2	2016-02-23
Method for monitoring alignment between contact holes and polycrystalline silicon gate Grant 9,080,863 - Ni , et al. July 14, 2	2015-07-14
Method of inspecting misalignment of polysilicon gate Grant 8,987,013 - Fan , et al. March 24, 2	2015-03-24
Method of Inspecting Misalignment of Polysilicon Gate App 20150004723 - FAN; Rongwei ; et al.	2015-01-01
Method Of Detecting And Measuring Contact Alignment Shift Relative To Gate Structures In A Semicondcutor Device App 20140377888 - Fan; Rongwei ; et al.	2014-12-25
Method of detecting the circular uniformity of the semiconductor circular contact holes Grant 8,865,482 - Wang , et al. October 21, 2	2014-10-21
Method Of Detecting The Circular Uniformity Of The Semiconductor Circular Contact Holes App 20140127835 - WANG; Kai ; et al.	2014-05-08
Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices Grant 8,658,438 - Fan , et al. February 25, 2	2014-02-25
Measurement Of Lateral Diffusion Of Implanted Ions In Doped Well Region Of Semiconductor Devices App 20140011304 - FAN; Rongwei ; et al.	2014-01-09
Method For Monitoring Alignment Between Contact Holes And Polycrystalline Silicon Gate App 20130342842 - Ni; Qiliang ; et al.	2013-12-26
Method For Monitoring Devices In Semiconductor Process App 20130137196 - CHEN; Hunglin ; et al.	2013-05-30
Semiconductor Yield Management System App 20130138239 - CHEN; Hunglin ; et al.	2013-05-30
Method for Preventing Wafer Edge Peeling in Metal Wiring Process App 20080124891 - Zhang; Kegang ; et al.	2008-05-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.