loadpatents
Patent applications and USPTO patent grants for Chen; Guangqing.The latest application filed is for "method and apparatus for design of a metrology target".
Patent | Date |
---|---|
Method And Apparatus For Design Of A Metrology Target App 20220113638 - Chen; Guangqing ;   et al. | 2022-04-14 |
Method and apparatus for design of a metrology target Grant 11,221,560 - Chen , et al. January 11, 2 | 2022-01-11 |
Process based metrology target design Grant 10,296,681 - Chen , et al. | 2019-05-21 |
Method and apparatus for design of a metrology target Grant 10,296,692 - Chen , et al. | 2019-05-21 |
Process Based Metrology Target Design App 20180268093 - CHEN; Guangqing ;   et al. | 2018-09-20 |
Process based metrology target design Grant 10,007,744 - Chen , et al. June 26, 2 | 2018-06-26 |
Method And Apparatus For Inspection And Metrology App 20180046737 - WILLEMS; Lotte Marloes ;   et al. | 2018-02-15 |
Method and apparatus for design of a metrology target Grant 9,804,504 - Chen , et al. October 31, 2 | 2017-10-31 |
Method and apparatus for design of a metrology target Grant 9,494,874 - Chen , et al. November 15, 2 | 2016-11-15 |
Method And Apparatus For Design Of A Metrology Target App 20160252820 - CHEN; Guangqing ;   et al. | 2016-09-01 |
Method and apparatus for design of a metrology target Grant 9,355,200 - Chen , et al. May 31, 2 | 2016-05-31 |
Process Based Metrology Target Design App 20160140267 - CHEN; Guangqing ;   et al. | 2016-05-19 |
Method And Apparatus For Design Of A Metrology Target App 20150185625 - CHEN; Guangqing ;   et al. | 2015-07-02 |
Method And Apparatus For Design Of A Metrology Target App 20150186582 - CHEN; Guangqing ;   et al. | 2015-07-02 |
Method And Apparatus For Design Of A Metrology Target App 20150186581 - Chen; Guangqing ;   et al. | 2015-07-02 |
Method And Apparatus For Design Of A Metrology Target App 20150185626 - CHEN; Guangqing ;   et al. | 2015-07-02 |
Method for lithography model calibration Grant 7,488,933 - Ye , et al. February 10, 2 | 2009-02-10 |
Method For Lithography Model Calibration App 20070032896 - Ye; Jun ;   et al. | 2007-02-08 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.