loadpatents
name:-0.0068371295928955
name:-0.00553297996521
name:-0.0027270317077637
Chen; Guangqing Patent Filings

Chen; Guangqing

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Guangqing.The latest application filed is for "method and apparatus for design of a metrology target".

Company Profile
3.8.10
  • Chen; Guangqing - Fremont CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And Apparatus For Design Of A Metrology Target
App 20220113638 - Chen; Guangqing ;   et al.
2022-04-14
Method and apparatus for design of a metrology target
Grant 11,221,560 - Chen , et al. January 11, 2
2022-01-11
Process based metrology target design
Grant 10,296,681 - Chen , et al.
2019-05-21
Method and apparatus for design of a metrology target
Grant 10,296,692 - Chen , et al.
2019-05-21
Process Based Metrology Target Design
App 20180268093 - CHEN; Guangqing ;   et al.
2018-09-20
Process based metrology target design
Grant 10,007,744 - Chen , et al. June 26, 2
2018-06-26
Method And Apparatus For Inspection And Metrology
App 20180046737 - WILLEMS; Lotte Marloes ;   et al.
2018-02-15
Method and apparatus for design of a metrology target
Grant 9,804,504 - Chen , et al. October 31, 2
2017-10-31
Method and apparatus for design of a metrology target
Grant 9,494,874 - Chen , et al. November 15, 2
2016-11-15
Method And Apparatus For Design Of A Metrology Target
App 20160252820 - CHEN; Guangqing ;   et al.
2016-09-01
Method and apparatus for design of a metrology target
Grant 9,355,200 - Chen , et al. May 31, 2
2016-05-31
Process Based Metrology Target Design
App 20160140267 - CHEN; Guangqing ;   et al.
2016-05-19
Method And Apparatus For Design Of A Metrology Target
App 20150185625 - CHEN; Guangqing ;   et al.
2015-07-02
Method And Apparatus For Design Of A Metrology Target
App 20150186582 - CHEN; Guangqing ;   et al.
2015-07-02
Method And Apparatus For Design Of A Metrology Target
App 20150186581 - Chen; Guangqing ;   et al.
2015-07-02
Method And Apparatus For Design Of A Metrology Target
App 20150185626 - CHEN; Guangqing ;   et al.
2015-07-02
Method for lithography model calibration
Grant 7,488,933 - Ye , et al. February 10, 2
2009-02-10
Method For Lithography Model Calibration
App 20070032896 - Ye; Jun ;   et al.
2007-02-08

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