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name:-0.0054781436920166
name:-0.0073750019073486
name:-0.00052690505981445
Chen; Ching-Too Patent Filings

Chen; Ching-Too

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Ching-Too.The latest application filed is for "method for testing micro sd devices".

Company Profile
0.8.11
  • Chen; Ching-Too - Chandler AZ
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for testing system-in-package devices
Grant 7,545,158 - Hopkins , et al. June 9, 2
2009-06-09
Apparatus for testing system-in-package devices
Grant 7,535,214 - Hopkins , et al. May 19, 2
2009-05-19
Apparatus for testing system-in-package devices
Grant 7,518,356 - Hopkins , et al. April 14, 2
2009-04-14
Test circuits of an apparatus for testing micro SD devices
Grant 7,518,357 - Hopkins , et al. April 14, 2
2009-04-14
Test circuits of an apparatus for testing system-in-package devices
Grant 7,514,914 - Hopkins , et al. April 7, 2
2009-04-07
Method for testing plurality of system-in-package devices using plurality of test circuits
Grant 7,489,155 - Hopkins , et al. February 10, 2
2009-02-10
Method for testing micro SD devices using test circuits
Grant 7,489,156 - Hopkins , et al. February 10, 2
2009-02-10
Method for testing micro SD devices using each test circuits
Grant 7,443,190 - Hopkins , et al. October 28, 2
2008-10-28
Apparatus for testing system-in-package devices
App 20080252319 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus for testing system-in-package devices
App 20080252312 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus for testing system-in-package devices
App 20080252317 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus for testing system-in-package devices
App 20080252314 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus for testing micro SD devices
App 20080252321 - Hopkins; James E. ;   et al.
2008-10-16
Method For Testing Micro Sd Devices Using Each Test Circuits
App 20080252318 - Hopkins; James E. ;   et al.
2008-10-16
Method for testing micro SD devices
App 20080252323 - Hopkins; James E. ;   et al.
2008-10-16
Method for testing system-in-package devices
App 20080252322 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus for testing micro SD devices
App 20080252320 - Hopkins; James E. ;   et al.
2008-10-16
Method for testing system-in-package devices
App 20080252313 - Hopkins; James E. ;   et al.
2008-10-16
Apparatus and method for detection of contaminant particles or component defects
App 20060066846 - Chen; Ching-Too ;   et al.
2006-03-30

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