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Patent applications and USPTO patent grants for Chen; Ching-Too.The latest application filed is for "method for testing micro sd devices".
Patent | Date |
---|---|
Method for testing system-in-package devices Grant 7,545,158 - Hopkins , et al. June 9, 2 | 2009-06-09 |
Apparatus for testing system-in-package devices Grant 7,535,214 - Hopkins , et al. May 19, 2 | 2009-05-19 |
Apparatus for testing system-in-package devices Grant 7,518,356 - Hopkins , et al. April 14, 2 | 2009-04-14 |
Test circuits of an apparatus for testing micro SD devices Grant 7,518,357 - Hopkins , et al. April 14, 2 | 2009-04-14 |
Test circuits of an apparatus for testing system-in-package devices Grant 7,514,914 - Hopkins , et al. April 7, 2 | 2009-04-07 |
Method for testing plurality of system-in-package devices using plurality of test circuits Grant 7,489,155 - Hopkins , et al. February 10, 2 | 2009-02-10 |
Method for testing micro SD devices using test circuits Grant 7,489,156 - Hopkins , et al. February 10, 2 | 2009-02-10 |
Method for testing micro SD devices using each test circuits Grant 7,443,190 - Hopkins , et al. October 28, 2 | 2008-10-28 |
Apparatus for testing system-in-package devices App 20080252319 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus for testing system-in-package devices App 20080252312 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus for testing system-in-package devices App 20080252317 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus for testing system-in-package devices App 20080252314 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus for testing micro SD devices App 20080252321 - Hopkins; James E. ;   et al. | 2008-10-16 |
Method For Testing Micro Sd Devices Using Each Test Circuits App 20080252318 - Hopkins; James E. ;   et al. | 2008-10-16 |
Method for testing micro SD devices App 20080252323 - Hopkins; James E. ;   et al. | 2008-10-16 |
Method for testing system-in-package devices App 20080252322 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus for testing micro SD devices App 20080252320 - Hopkins; James E. ;   et al. | 2008-10-16 |
Method for testing system-in-package devices App 20080252313 - Hopkins; James E. ;   et al. | 2008-10-16 |
Apparatus and method for detection of contaminant particles or component defects App 20060066846 - Chen; Ching-Too ;   et al. | 2006-03-30 |
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