Chen; Chien-Huei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chen; Chien-Huei.The latest application filed is for "hot spot defect detecting method and hot spot defect detecting system".

Company Profile

6.11.10

Chen; Chien-Huei - Kaohsiung TW
Chen; Chien-Huei - Kaohsiung City TW
Chen; Chien-Huei - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for semiconductor wafer inspection and system thereof Grant 11,231,376 - Chen , et al. January 25, 2	2022-01-25
Hot Spot Defect Detecting Method And Hot Spot Defect Detecting System App 20210118125 - Chen; Chien-Huei ; et al.	2021-04-22
Defect detecting method and defect detecting system Grant 10,964,014 - Chen March 30, 2	2021-03-30
Method For Semiconductor Wafer Inspection And System Thereof App 20210063319 - CHEN; CHIEN-HUEI ; et al.	2021-03-04
Hot spot defect detecting method and hot spot defect detecting system Grant 10,872,406 - Chen , et al. December 22, 2	2020-12-22
Defect inspection method and defect inspection system Grant 10,809,635 - Chen , et al. October 20, 2	2020-10-20
Hot Spot Defect Detecting Method And Hot Spot Defect Detecting System App 20190318471 - Chen; Chien-Huei ; et al.	2019-10-17
Defect Inspection Method And Defect Inspection System App 20190155164 - Chen; Chien-Huei ; et al.	2019-05-23
Defect Detecting Method, Defect Detecting System And Computer-readable Medium App 20190130551 - Chen; Chien-Huei	2019-05-02
Contour-based array inspection of patterned defects Grant 9,483,819 - Chen , et al. November 1, 2	2016-11-01
Contour-based Array Inspection Of Patterned Defects App 20140212024 - CHEN; Chien-Huei ; et al.	2014-07-31
Contour-based defect detection using an inspection apparatus Grant 8,669,523 - Chen , et al. March 11, 2	2014-03-11
Methods and apparatus for classification of defects using surface height attributes Grant 8,502,146 - Chen , et al. August 6, 2	2013-08-06
Methods And Apparatus For Classification Of Defects Using Surface Height Attributes App 20130082174 - CHEN; Chien-Huei ; et al.	2013-04-04
Contour-based Defect Detection Using An Inspection Apparatus App 20120298862 - CHEN; Chien-Huei ; et al.	2012-11-29
Apparatus And Methods For Real-time Three-dimensional Sem Imaging And Viewing Of Semiconductor Wafers App 20120223227 - CHEN; Chien-Huei ; et al.	2012-09-06
Outlier substrate inspection Grant 7,440,607 - Lin , et al. October 21, 2	2008-10-21
Interactive threshold tuning Grant 6,985,220 - Chen , et al. January 10, 2	2006-01-10

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