Chegal; Won

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chegal; Won.The latest application filed is for "normal incidence ellipsometer and method for measuring optical properties of sample by using same".

Company Profile

4.15.15

Chegal; Won - Daejeon KR
Chegal, Won - Daejon KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement method Grant 11,402,321 - Cho , et al. August 2, 2	2022-08-02
Normal Incidence Ellipsometer And Method For Measuring Optical Properties Of Sample By Using Same App 20210181090 - CHO; Yong Jai ; et al.	2021-06-17
High-sensitive Biosensor Chip Using High Extinction Coefficient Marker And Dielectric Substrate, Measurement System, And Measurement Method App 20210072149 - CHO; Hyun-mo ; et al.	2021-03-11
Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method Grant 10,921,241 - Cho , et al. February 16, 2	2021-02-16
Liquid Immersion Micro-channel Measurement Device And Measurement Method Which Are Based On Trapezoidal Incident Structure Prism App 20190346363 - CHO; Hyun Mo ; et al.	2019-11-14
Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution Grant 10,458,901 - Cho , et al. Oc	2019-10-29
Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same Grant 10,317,334 - Cho , et al.	2019-06-11
Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same Grant 10,145,785 - Cho , et al. De	2018-12-04
Achromatic Rotating-element Ellipsometer And Method For Measuring Mueller-matrix Elements Of Sample Using The Same App 20180113069 - CHO; Yong Jai ; et al.	2018-04-26
Oblique Incidence, Prism-incident, Silicon-based, Immersion Microchannel-based Measurement Device And Measurement Method App 20180100795 - CHO; Hyun Mo ; et al.	2018-04-12
Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same Grant 9,581,498 - Cho , et al. February 28, 2	2017-02-28
Rotating-Element Spectroscopic Ellipsometer and Method for Measurement Precision Prediction of Rotating-Element Spectroscopic Ellipsometer, Recording Medium Storing Program for Executing the Same, and Computer Program Stored in Medium for Executing the Same App 20160169742 - Cho; Yong Jai ; et al.	2016-06-16
Optical Element Rotation Type Mueller-matrix Ellipsometer And Method For Measuring Mueller-matrix Of Sample Using The Same App 20160153894 - Cho; Yong Jai ; et al.	2016-06-02
Apparatus And Method For Simultaneously Measuring Characteristics Of Molecular Junctions And Refractive Index Of Buffer Solution App 20150253243 - Cho; Hyun Mo ; et al.	2015-09-10
Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer Grant 8,705,039 - Cho , et al. April 22, 2	2014-04-22
Multi-channel surface plasmon resonance sensor using beam profile ellipsometry Grant 8,705,033 - Cho , et al. April 22, 2	2014-04-22
Measurement of Fourier coefficients using integrating photometric detector Grant 8,447,546 - Cho , et al. May 21, 2	2013-05-21
Minute measuring instrument for high speed and large area and method thereof Grant 8,300,221 - Cho , et al. October 30, 2	2012-10-30
Surface Plasmon Resonance Sensor Using Beam Profile Ellipsometry App 20120057146 - Cho; Hyun Mo ; et al.	2012-03-08
Multi-channel Surface Plasmon Resonance Sensor Using Beam Profile Ellipsometry App 20110216320 - Cho; Hyun Mo ; et al.	2011-09-08
Single polarizer focused-beam ellipsometer Grant 8,009,292 - Choi , et al. August 30, 2	2011-08-30
Focused-beam ellipsometer Grant 8,004,677 - Lee , et al. August 23, 2	2011-08-23
Measurement of Fourier Coefficients Using Integrating Photometric Detector App 20110077883 - CHO; Yong Jai ; et al.	2011-03-31
Minute Measuring Instrument For High Speed And Large Area And The Method Of Thereof App 20100321693 - Cho; Yong Jai ; et al.	2010-12-23
Single-polarizer Focused-beam Ellipsometer App 20100296092 - Cho; Yong Jai ; et al.	2010-11-25
Focused-beam ellipsometer App 20100045985 - Lee; Joong Whan ; et al.	2010-02-25
Ellipsometry system and method using spectral imaging App 20050157295 - Chegal, Won ; et al.	2005-07-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.