loadpatents
name:-0.0073778629302979
name:-0.0058422088623047
name:-0.00053191184997559
Chard; Jeffrey A. Patent Filings

Chard; Jeffrey A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chard; Jeffrey A..The latest application filed is for "data flow management in generating profile models used in optical metrology".

Company Profile
0.3.6
  • Chard; Jeffrey A. - Sunnyvale CA
  • Chard; Jeffrey A. - Madison WI
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Evaluating a profile model to characterize a structure to be examined using optical metrology
Grant 7,518,740 - Chard , et al. April 14, 2
2009-04-14
Parallel profile determination for an optical metrology system
Grant 7,469,192 - Khuong , et al. December 23, 2
2008-12-23
Data flow management in generating profile models used in optical metrology
App 20080091724 - Qiu; Hong ;   et al.
2008-04-17
Data flow management in generating different signal formats used in optical metrology
App 20080089574 - Qiu; Hong ;   et al.
2008-04-17
Parallel profile determination in optical metrology
App 20080013108 - Khuong; Tri Thanh ;   et al.
2008-01-17
Generating a profile model to characterize a structure to be examined using optical metrology
App 20080013107 - Chard; Jeffrey A. ;   et al.
2008-01-17
Parallel profile determination for an optical metrology system
App 20080015812 - Khuong; Tri Thanh ;   et al.
2008-01-17
Evaluating a profile model to characterize a structure to be examined using optical metrology
App 20080007738 - Chard; Jeffrey A. ;   et al.
2008-01-10
Tool path planning process for component by layered manufacture
Grant 6,823,230 - Jamalabad , et al. November 23, 2
2004-11-23

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