Chappelow; Ronald E.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Chappelow; Ronald E..The latest application filed is for "measurement of registration of overlaid test patterns by the use of reflected light".
- Chappelow; Ronald E. - Essex Junction VT
- Chappelow; Ronald E. - Jericho VT
- Chappelow; Ronald E. - Pleasant Valley NY
- Chappelow; Ronald E. - Salt Point NY
| Patent | Date |
|---|---|
| Measurement of registration of overlaid test patterns by the use of reflected light Grant 4,757,207 - Chappelow , et al. July 12, 1 | 1988-07-12 |
| Method of forming deposits from reactive gases Grant 4,132,818 - Chappelow , et al. January 2, 1 | 1979-01-02 |
| Method for forming silicon conductive layers utilizing differential etching rates Grant 3,892,606 - Chappelow , et al. July 1, 1 | 1975-07-01 |
| Boron Silicide Method For Making Thermally Oxidized Boron Doped Poly-crystalline Silicon Having Minimum Resistivity Grant 3,874,920 - Chappelow , et al. April 1, 1 | 1975-04-01 |
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