Chao; Hui-yun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chao; Hui-yun.The latest application filed is for "method of test probe alignment control".

Company Profile

1.13.11

Chao; Hui-yun - Zhubei TW
Chao; Hui-yun - Zhubei City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of test probe alignment control Grant 10,161,965 - Chen , et al. Dec	2018-12-25
Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes Grant 9,165,843 - Chen , et al. October 20, 2	2015-10-20
2D/3D analysis for abnormal tools and stages diagnosis Grant 9,158,867 - Lin , et al. October 13, 2	2015-10-13
Method of Test Probe Alignment Control App 20150192616 - Chen; Jui-Long ; et al.	2015-07-09
Systems And Methods Of Automatically Detecting Failure Patterns For Semiconductor Wafer Fabrication Processes App 20150125970 - CHEN; Jui-Long ; et al.	2015-05-07
Method of test probe alignment control Grant 9,000,798 - Chen , et al. April 7, 2	2015-04-07
Auto device skew manufacturing Grant 8,942,840 - Chen , et al. January 27, 2	2015-01-27
Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes Grant 8,938,698 - Chen , et al. January 20, 2	2015-01-20
Systems And Methods Of Automatically Detecting Failure Patterns For Semiconductor Wafer Fabrication Processes App 20140106474 - CHEN; Jui-Long ; et al.	2014-04-17
2D/3D Analysis for Abnormal Tools and Stages Diagnosis App 20140100684 - Lin; Chun-Hsien ; et al.	2014-04-10
Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes Grant 8,627,251 - Chen , et al. January 7, 2	2014-01-07
Method Of Test Probe Alignment Control App 20130335109 - Chen; Jui-Long ; et al.	2013-12-19
Systems And Methods Of Automatically Detecting Failure Patterns For Semiconductor Wafer Fabrication Processes App 20130288403 - CHEN; Jui-Long ; et al.	2013-10-31
Auto Device Skew Manufacturing App 20130131858 - Chen; Jui-Long ; et al.	2013-05-23
System and method for data mining and feature tracking for fab-wide prediction and control Grant 8,406,912 - Chen , et al. March 26, 2	2013-03-26
Auto device skew manufacturing Grant 8,391,999 - Chen , et al. March 5, 2	2013-03-05
System And Method For Data Mining And Feature Tracking For Fab-wide Prediction And Control App 20110320026 - Chen; Jui-Long ; et al.	2011-12-29
Auto Device Skew Manufacturing App 20110307088 - Chen; Jui-Long ; et al.	2011-12-15

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